Abstract
The 'moving-screen' or 'pattern magnification' method of calibration for electron backscatter diffraction (EBSD) was reformulated to develop a high-precision technique requiring no crystallographic knowledge of the specimen and no initial estimates of the calibration parameters. The technique depends upon the accurate displacement of the screen and camera assembly. Corresponding points are selected, interactively, from EBSD patterns. It is suggested that, as an alternative, the selection of points from the Hough transform could lead to a completely automated routine.
| Original language | English |
|---|---|
| Pages (from-to) | 246-247 |
| Number of pages | 2 |
| Journal | Journal of Microscopy |
| Volume | 227 |
| Issue number | 3 |
| DOIs | |
| State | Published - Sep 2007 |
Keywords
- Calibration
- Electron backscatter diffraction
- Moving-screen technique
- Scanning electron microscopy
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