TY - JOUR
T1 - Determination of pattern centre in EBSD using the moving-screen technique
AU - Carpenter, D. A.
AU - Pugh, J. L.
AU - Richardson, G. D.
AU - Mooney, L. R.
PY - 2007/9
Y1 - 2007/9
N2 - The 'moving-screen' or 'pattern magnification' method of calibration for electron backscatter diffraction (EBSD) was reformulated to develop a high-precision technique requiring no crystallographic knowledge of the specimen and no initial estimates of the calibration parameters. The technique depends upon the accurate displacement of the screen and camera assembly. Corresponding points are selected, interactively, from EBSD patterns. It is suggested that, as an alternative, the selection of points from the Hough transform could lead to a completely automated routine.
AB - The 'moving-screen' or 'pattern magnification' method of calibration for electron backscatter diffraction (EBSD) was reformulated to develop a high-precision technique requiring no crystallographic knowledge of the specimen and no initial estimates of the calibration parameters. The technique depends upon the accurate displacement of the screen and camera assembly. Corresponding points are selected, interactively, from EBSD patterns. It is suggested that, as an alternative, the selection of points from the Hough transform could lead to a completely automated routine.
KW - Calibration
KW - Electron backscatter diffraction
KW - Moving-screen technique
KW - Scanning electron microscopy
UR - http://www.scopus.com/inward/record.url?scp=34548337063&partnerID=8YFLogxK
U2 - 10.1111/j.1365-2818.2007.01807.x
DO - 10.1111/j.1365-2818.2007.01807.x
M3 - Article
AN - SCOPUS:34548337063
SN - 0022-2720
VL - 227
SP - 246
EP - 247
JO - Journal of Microscopy
JF - Journal of Microscopy
IS - 3
ER -