Determination of optical birefringence by using off-axis transmission ellipsometry

Gerald E. Jellison; Christopher M. Rouleau

doi:10.1364/AO.44.003153

Determination of optical birefringence by using off-axis transmission ellipsometry

Gerald E. Jellison, Christopher M. Rouleau

Functional Hybrid Nanomaterials

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

Utilizing transmission ellipsometry at small angles of incidence, it is shown that c-cut uniaxial samples can be used to determine both the miscut of the optic axis with respect to the plane of incidence as well as very accurate values of the spectroscopic birefringence. For example, wafers of ZnO, LiNbO₃, and 6H-SiC single-crystals are examined and the miscut direction and the spectroscopic birefringence are determined. While all materials show strong dispersion in birefringence, ZnO exhibits a distinct Isotropic point at 396.8 nm.

Original language	English
Pages (from-to)	3153-3159
Number of pages	7
Journal	Applied Optics
Volume	44
Issue number	16
DOIs	https://doi.org/10.1364/AO.44.003153
State	Published - Jun 1 2005

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@article{760c1c164ade44b1886aa61d35f0c916,

title = "Determination of optical birefringence by using off-axis transmission ellipsometry",

abstract = "Utilizing transmission ellipsometry at small angles of incidence, it is shown that c-cut uniaxial samples can be used to determine both the miscut of the optic axis with respect to the plane of incidence as well as very accurate values of the spectroscopic birefringence. For example, wafers of ZnO, LiNbO3, and 6H-SiC single-crystals are examined and the miscut direction and the spectroscopic birefringence are determined. While all materials show strong dispersion in birefringence, ZnO exhibits a distinct Isotropic point at 396.8 nm.",

author = "Jellison, {Gerald E.} and Rouleau, {Christopher M.}",

year = "2005",

month = jun,

day = "1",

doi = "10.1364/AO.44.003153",

language = "English",

volume = "44",

pages = "3153--3159",

journal = "Applied Optics",

issn = "1559-128X",

publisher = "Optica Publishing Group",

number = "16",

}

TY - JOUR

T1 - Determination of optical birefringence by using off-axis transmission ellipsometry

AU - Jellison, Gerald E.

AU - Rouleau, Christopher M.

PY - 2005/6/1

Y1 - 2005/6/1

N2 - Utilizing transmission ellipsometry at small angles of incidence, it is shown that c-cut uniaxial samples can be used to determine both the miscut of the optic axis with respect to the plane of incidence as well as very accurate values of the spectroscopic birefringence. For example, wafers of ZnO, LiNbO3, and 6H-SiC single-crystals are examined and the miscut direction and the spectroscopic birefringence are determined. While all materials show strong dispersion in birefringence, ZnO exhibits a distinct Isotropic point at 396.8 nm.

AB - Utilizing transmission ellipsometry at small angles of incidence, it is shown that c-cut uniaxial samples can be used to determine both the miscut of the optic axis with respect to the plane of incidence as well as very accurate values of the spectroscopic birefringence. For example, wafers of ZnO, LiNbO3, and 6H-SiC single-crystals are examined and the miscut direction and the spectroscopic birefringence are determined. While all materials show strong dispersion in birefringence, ZnO exhibits a distinct Isotropic point at 396.8 nm.

UR - http://www.scopus.com/inward/record.url?scp=20544468760&partnerID=8YFLogxK

U2 - 10.1364/AO.44.003153

DO - 10.1364/AO.44.003153

M3 - Article

AN - SCOPUS:20544468760

SN - 1559-128X

VL - 44

SP - 3153

EP - 3159

JO - Applied Optics

JF - Applied Optics

IS - 16

ER -

Determination of optical birefringence by using off-axis transmission ellipsometry

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