Determination of lamellar twisting manner in a banded spherulite with scanning microbeam X-ray scattering

Tatsuya Kikuzuki, Yuya Shinohara, Yoshinobu Nozue, Kazuki Ito, Yoshiyuki Amemiya

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

We investigated lamellar twisting manner in a banded spherulite, the blend of poly-(ε-caprolactone) and poly-(vinyl butyral), with scanning microbeam X-ray diffraction. We obtained the diffraction contour intensity map with a scanning pitch of 1 μm by employing a rotation of a spherulite around its radial direction along which the microbeam scans. The results confirm that the twisting manner depends on the crystallization temperature and that it changes from continuous twisting to step-wise twisting with the increase of crystallization temperature. Moreover, we observed that the phase of long-period lamellar twisting advanced by about 15° compared to that of short-period lamella. In addition, it was confirmed that c-axis of packing structure was normal to lamella, which was represented by dominant short-period lamella.

Original languageEnglish
Pages (from-to)1632-1638
Number of pages7
JournalPolymer
Volume51
Issue number7
DOIs
StatePublished - Mar 24 2010
Externally publishedYes

Keywords

  • A banded spherulite
  • Lamellar twisting
  • Scanning microbeam X-ray diffraction

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