Determination of Boron and Lithium in Nuclear Materials by Secondary Ion Mass Spectrometry

W. H. Christie; R. E. Eby; R. J. Warmack; Larry Landau

doi:10.1021/ac00224a006

Determination of Boron and Lithium in Nuclear Materials by Secondary Ion Mass Spectrometry

W. H. Christie
, R. E. Eby
, R. J. Warmack
, Larry Landau

Sensors and Electronics

Research output: Contribution to journal › Article › peer-review

21 Scopus citations

Abstract

Secondary ion mass spectrometry (SIMS) has been used for the rapid, accurate analysis of B and LI In various nuclear materials. The problem of sample charging observed in the analysis of Insulator materials has been overcome by distributing the sample as a thin film on a conducting substrate. No sample chemistry Is required for isotopic measurements and only sample dissolution Is necessary for the application of Isotope dilution methods for quantitative analysis. The high sensitivity of SIMS for B and Li makes It possible to analyze sufficiently small radioactive samples so that radiation is reduced to acceptable levels for safe handling. The precision of SIMS isotopic analysis for natural B samples is about 0.5% and is about 1.0% for natural LI samples.

Original language	English
Pages (from-to)	13-17
Number of pages	5
Journal	Analytical Chemistry
Volume	53
Issue number	1
DOIs	https://doi.org/10.1021/ac00224a006
State	Published - Jan 1981

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title = "Determination of Boron and Lithium in Nuclear Materials by Secondary Ion Mass Spectrometry",

abstract = "Secondary ion mass spectrometry (SIMS) has been used for the rapid, accurate analysis of B and LI In various nuclear materials. The problem of sample charging observed in the analysis of Insulator materials has been overcome by distributing the sample as a thin film on a conducting substrate. No sample chemistry Is required for isotopic measurements and only sample dissolution Is necessary for the application of Isotope dilution methods for quantitative analysis. The high sensitivity of SIMS for B and Li makes It possible to analyze sufficiently small radioactive samples so that radiation is reduced to acceptable levels for safe handling. The precision of SIMS isotopic analysis for natural B samples is about 0.5\% and is about 1.0\% for natural LI samples.",

author = "Christie, \{W. H.\} and Eby, \{R. E.\} and Warmack, \{R. J.\} and Larry Landau",

year = "1981",

month = jan,

doi = "10.1021/ac00224a006",

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pages = "13--17",

journal = "Analytical Chemistry",

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T1 - Determination of Boron and Lithium in Nuclear Materials by Secondary Ion Mass Spectrometry

AU - Christie, W. H.

AU - Eby, R. E.

AU - Warmack, R. J.

AU - Landau, Larry

PY - 1981/1

Y1 - 1981/1

N2 - Secondary ion mass spectrometry (SIMS) has been used for the rapid, accurate analysis of B and LI In various nuclear materials. The problem of sample charging observed in the analysis of Insulator materials has been overcome by distributing the sample as a thin film on a conducting substrate. No sample chemistry Is required for isotopic measurements and only sample dissolution Is necessary for the application of Isotope dilution methods for quantitative analysis. The high sensitivity of SIMS for B and Li makes It possible to analyze sufficiently small radioactive samples so that radiation is reduced to acceptable levels for safe handling. The precision of SIMS isotopic analysis for natural B samples is about 0.5% and is about 1.0% for natural LI samples.

AB - Secondary ion mass spectrometry (SIMS) has been used for the rapid, accurate analysis of B and LI In various nuclear materials. The problem of sample charging observed in the analysis of Insulator materials has been overcome by distributing the sample as a thin film on a conducting substrate. No sample chemistry Is required for isotopic measurements and only sample dissolution Is necessary for the application of Isotope dilution methods for quantitative analysis. The high sensitivity of SIMS for B and Li makes It possible to analyze sufficiently small radioactive samples so that radiation is reduced to acceptable levels for safe handling. The precision of SIMS isotopic analysis for natural B samples is about 0.5% and is about 1.0% for natural LI samples.

UR - https://www.scopus.com/pages/publications/0019355359

U2 - 10.1021/ac00224a006

DO - 10.1021/ac00224a006

M3 - Article

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SN - 0003-2700

VL - 53

SP - 13

EP - 17

JO - Analytical Chemistry

JF - Analytical Chemistry

IS - 1

ER -

Determination of Boron and Lithium in Nuclear Materials by Secondary Ion Mass Spectrometry

Abstract

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