Determination of Auger sensitivity factors for Al-rich quasicrystals

C. J. Jenks; T. E. Bloomer; M. J. Kramer; T. A. Lograsso; D. W. Delaney; A. R. Ross; D. J. Sordelet; M. F. Besser; P. A. Thiel

doi:10.1016/S0169-4332(01)00326-9

Determination of Auger sensitivity factors for Al-rich quasicrystals

C. J. Jenks, T. E. Bloomer, M. J. Kramer, T. A. Lograsso, D. W. Delaney, A. R. Ross, D. J. Sordelet, M. F. Besser, P. A. Thiel

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

We discuss and compare approaches to using Auger data for semi-quantitative determination of surface compositions of Al-based quasicrystals. We have examined two quasicrystalline phases: icosahedral Al-Cu-Fe and Al-Pd-Mn. We find that sensitivity factors obtained from pure elemental standards lead to underestimation of concentrations by as much as a factor of 2.5 for the minor constituents, Fe and Mn, and to overestimation by as much as a factor of 1.2 for the major constituent, Al. Surprisingly, calibration with a crystalline phase close in composition to the quasicrystal does not necessarily lead to more accurate results. Auger analyses of fractured surfaces, which are then compared to bulk analyses, is the best option for sensitivity factor calibration. Even without absolute calibration of sensitivity factors, however, surface analysis is extremely useful for detection of secondary phases, and is superior to common bulk analysis methods.

Original language	English
Pages (from-to)	57-64
Number of pages	8
Journal	Applied Surface Science
Volume	180
Issue number	1-2
DOIs	https://doi.org/10.1016/S0169-4332(01)00326-9
State	Published - Aug 1 2001
Externally published	Yes

Funding

This work was supported by the Director, Office of Energy Research, Office of Basic Energy Sciences, Materials Sciences Division, of the US Department of Energy under Contract No. W-405-Eng-82.

Funders	Funder number
Office of Basic Energy Sciences
Office of Energy Research
US Department of Energy
Division of Materials Sciences and Engineering

Keywords

Auger electron spectroscopy
Quasicrystals
Surface composition

Access to Document

10.1016/S0169-4332(01)00326-9

Cite this

@article{48d147cc5ed8401280beed212169e6da,

title = "Determination of Auger sensitivity factors for Al-rich quasicrystals",

abstract = "We discuss and compare approaches to using Auger data for semi-quantitative determination of surface compositions of Al-based quasicrystals. We have examined two quasicrystalline phases: icosahedral Al-Cu-Fe and Al-Pd-Mn. We find that sensitivity factors obtained from pure elemental standards lead to underestimation of concentrations by as much as a factor of 2.5 for the minor constituents, Fe and Mn, and to overestimation by as much as a factor of 1.2 for the major constituent, Al. Surprisingly, calibration with a crystalline phase close in composition to the quasicrystal does not necessarily lead to more accurate results. Auger analyses of fractured surfaces, which are then compared to bulk analyses, is the best option for sensitivity factor calibration. Even without absolute calibration of sensitivity factors, however, surface analysis is extremely useful for detection of secondary phases, and is superior to common bulk analysis methods.",

keywords = "Auger electron spectroscopy, Quasicrystals, Surface composition",

author = "Jenks, {C. J.} and Bloomer, {T. E.} and Kramer, {M. J.} and Lograsso, {T. A.} and Delaney, {D. W.} and Ross, {A. R.} and Sordelet, {D. J.} and Besser, {M. F.} and Thiel, {P. A.}",

year = "2001",

month = aug,

day = "1",

doi = "10.1016/S0169-4332(01)00326-9",

language = "English",

volume = "180",

pages = "57--64",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Determination of Auger sensitivity factors for Al-rich quasicrystals

AU - Jenks, C. J.

AU - Bloomer, T. E.

AU - Kramer, M. J.

AU - Lograsso, T. A.

AU - Delaney, D. W.

AU - Ross, A. R.

AU - Sordelet, D. J.

AU - Besser, M. F.

AU - Thiel, P. A.

PY - 2001/8/1

Y1 - 2001/8/1

N2 - We discuss and compare approaches to using Auger data for semi-quantitative determination of surface compositions of Al-based quasicrystals. We have examined two quasicrystalline phases: icosahedral Al-Cu-Fe and Al-Pd-Mn. We find that sensitivity factors obtained from pure elemental standards lead to underestimation of concentrations by as much as a factor of 2.5 for the minor constituents, Fe and Mn, and to overestimation by as much as a factor of 1.2 for the major constituent, Al. Surprisingly, calibration with a crystalline phase close in composition to the quasicrystal does not necessarily lead to more accurate results. Auger analyses of fractured surfaces, which are then compared to bulk analyses, is the best option for sensitivity factor calibration. Even without absolute calibration of sensitivity factors, however, surface analysis is extremely useful for detection of secondary phases, and is superior to common bulk analysis methods.

AB - We discuss and compare approaches to using Auger data for semi-quantitative determination of surface compositions of Al-based quasicrystals. We have examined two quasicrystalline phases: icosahedral Al-Cu-Fe and Al-Pd-Mn. We find that sensitivity factors obtained from pure elemental standards lead to underestimation of concentrations by as much as a factor of 2.5 for the minor constituents, Fe and Mn, and to overestimation by as much as a factor of 1.2 for the major constituent, Al. Surprisingly, calibration with a crystalline phase close in composition to the quasicrystal does not necessarily lead to more accurate results. Auger analyses of fractured surfaces, which are then compared to bulk analyses, is the best option for sensitivity factor calibration. Even without absolute calibration of sensitivity factors, however, surface analysis is extremely useful for detection of secondary phases, and is superior to common bulk analysis methods.

KW - Auger electron spectroscopy

KW - Quasicrystals

KW - Surface composition

UR - http://www.scopus.com/inward/record.url?scp=0035426834&partnerID=8YFLogxK

U2 - 10.1016/S0169-4332(01)00326-9

DO - 10.1016/S0169-4332(01)00326-9

M3 - Article

AN - SCOPUS:0035426834

SN - 0169-4332

VL - 180

SP - 57

EP - 64

JO - Applied Surface Science

JF - Applied Surface Science

IS - 1-2

ER -

Determination of Auger sensitivity factors for Al-rich quasicrystals

Abstract

Funding

Keywords

Access to Document

Other files and links

Fingerprint

Cite this