Detectors: Figures of Merit

Panos G. Datskos, Nickolay V. Lavrik

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

3 Scopus citations

Abstract

To analyze, quantify, and compare the performance of infrared (IR) imaging devices, such as various types of focal plane arrays (FPAs), it is essential to have an in-depth understanding of their figures of merit. In this entry, we discuss a series of figures of merit that are applicable to both cooled and uncooled IR detectors and systems. We provide a more detailed analysis of these figures of merit for the case of uncooled thermal detectors based on micro-electro-mechanical systems (MEMS). In particular, we discuss and analyze the different sources (and mechanisms) of noise present in MEMS IR detectors. These noises inevitably influence the respective figures of merit for the MEMS IR detectors and ultimately affect the fundamental limits of their performance.

Original languageEnglish
Title of host publicationEncyclopedia of Optical and Photonic Engineering Second Edition
PublisherCRC Press
Pages451-459
Number of pages9
ISBN (Electronic)9781351247177
ISBN (Print)9781439851012
DOIs
StatePublished - Jan 1 2015

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