Detection of plasmonic behavior in colloidal indium tin oxide films by impedance spectroscopy

Salil M. Joshi; Ning Xia; Yolande Berta; Yong Ding; Rosario A. Gerhardt; Kenneth C. Littrell; Eric Woods; Mengkun Tian

doi:10.1557/mrc.2020.22

Detection of plasmonic behavior in colloidal indium tin oxide films by impedance spectroscopy

Salil M. Joshi, Ning Xia, Yolande Berta, Yong Ding, Rosario A. Gerhardt, Kenneth C. Littrell, Eric Woods, Mengkun Tian

Instrument Development Group

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Impedance spectroscopy was conducted on colloidal ITO thin films that had been subjected to alternating oxygen and argon plasma treatments, followed by air annealing from 150 to 750 °C. An equivalent circuit consisting of an RC element nested within another RC element, featuring a negative resistance and a negative capacitance, fitted the data well. These results are interpreted as being due to surface plasmons that are a function of the presence of nanoporous ITO-rich regions surrounded by isolated ITO nanoparticles coated with an amorphous polymer that intertwines with the ITO-rich regions as a function of annealing treatment.

Original language	English
Pages (from-to)	278-285
Number of pages	8
Journal	MRS Communications
Volume	10
Issue number	2
DOIs	https://doi.org/10.1557/mrc.2020.22
State	Published - Jun 1 2020

Bibliographical note

Publisher Copyright:
Copyright © Materials Research Society 2020.

Funding

S.M. Joshi was funded by a fellowship from the Renewable Bioproducts Institute (RBI) [formerly known as the Institute for Paper Science and Technology (IPST)]. Additional support from the US Department of Energy under DE-FG 02-03-ER 46035 and the Goizueta Foundation faculty chair is also gratefully acknowledged. T.J. Rudzik is acknowledged for collecting the optical images. The neutron scattering work was conducted with support from the High Flux Isotope Reactor, a DOE Office of Science User facility operated by the Oak Ridge National Laboratory. The TEM work was performed at the Materials Characterization Facility (MCF) at Georgia Tech. The MCF is jointly supported by the GT Institute for Materials (IMat) and the Institute for Electronics and Nanotechnology (IEN), which is a member of the National Nanotechnology Coordinated Infrastructure supported by the National Science Foundation (Grant ECCS-1542174).

Funders	Funder number
GT Institute for Materials
IMat
IPST
Institute for Paper Science and Technology
US Department of Energy	DE-FG 02-03-ER 46035
National Science Foundation	ECCS-1542174
Oak Ridge National Laboratory
Goizueta Foundation
Renewable Bioproducts Institute

Access to Document

10.1557/mrc.2020.22

Cite this

@article{9b41d1208fa04f0c986766e406f0240a,

title = "Detection of plasmonic behavior in colloidal indium tin oxide films by impedance spectroscopy",

abstract = "Impedance spectroscopy was conducted on colloidal ITO thin films that had been subjected to alternating oxygen and argon plasma treatments, followed by air annealing from 150 to 750 °C. An equivalent circuit consisting of an RC element nested within another RC element, featuring a negative resistance and a negative capacitance, fitted the data well. These results are interpreted as being due to surface plasmons that are a function of the presence of nanoporous ITO-rich regions surrounded by isolated ITO nanoparticles coated with an amorphous polymer that intertwines with the ITO-rich regions as a function of annealing treatment.",

author = "Joshi, {Salil M.} and Ning Xia and Yolande Berta and Yong Ding and Gerhardt, {Rosario A.} and Littrell, {Kenneth C.} and Eric Woods and Mengkun Tian",

note = "Publisher Copyright: Copyright {\textcopyright} Materials Research Society 2020.",

year = "2020",

month = jun,

day = "1",

doi = "10.1557/mrc.2020.22",

language = "English",

volume = "10",

pages = "278--285",

journal = "MRS Communications",

issn = "2159-6859",

publisher = "Materials Research Society",

number = "2",

}

TY - JOUR

T1 - Detection of plasmonic behavior in colloidal indium tin oxide films by impedance spectroscopy

AU - Joshi, Salil M.

AU - Xia, Ning

AU - Berta, Yolande

AU - Ding, Yong

AU - Gerhardt, Rosario A.

AU - Littrell, Kenneth C.

AU - Woods, Eric

AU - Tian, Mengkun

PY - 2020/6/1

Y1 - 2020/6/1

N2 - Impedance spectroscopy was conducted on colloidal ITO thin films that had been subjected to alternating oxygen and argon plasma treatments, followed by air annealing from 150 to 750 °C. An equivalent circuit consisting of an RC element nested within another RC element, featuring a negative resistance and a negative capacitance, fitted the data well. These results are interpreted as being due to surface plasmons that are a function of the presence of nanoporous ITO-rich regions surrounded by isolated ITO nanoparticles coated with an amorphous polymer that intertwines with the ITO-rich regions as a function of annealing treatment.

AB - Impedance spectroscopy was conducted on colloidal ITO thin films that had been subjected to alternating oxygen and argon plasma treatments, followed by air annealing from 150 to 750 °C. An equivalent circuit consisting of an RC element nested within another RC element, featuring a negative resistance and a negative capacitance, fitted the data well. These results are interpreted as being due to surface plasmons that are a function of the presence of nanoporous ITO-rich regions surrounded by isolated ITO nanoparticles coated with an amorphous polymer that intertwines with the ITO-rich regions as a function of annealing treatment.

UR - http://www.scopus.com/inward/record.url?scp=85083312942&partnerID=8YFLogxK

U2 - 10.1557/mrc.2020.22

DO - 10.1557/mrc.2020.22

M3 - Article

AN - SCOPUS:85083312942

SN - 2159-6859

VL - 10

SP - 278

EP - 285

JO - MRS Communications

JF - MRS Communications

IS - 2

ER -

Detection of plasmonic behavior in colloidal indium tin oxide films by impedance spectroscopy

Abstract

Bibliographical note

Funding

Access to Document

Other files and links

Fingerprint

Cite this