Detection of percolating paths in polyhedral segregated network composites using electrostatic force microscopy and conductive atomic force microscopy

J. Waddell, R. Ou, C. J. Capozzi, S. Gupta, C. A. Parker, R. A. Gerhardt, K. Seal, S. V. Kalinin, A. P. Baddorf

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Abstract

Composite specimens possessing polyhedral segregated network microstructures require a very small amount of nanosize filler, <1 vol %, to reach percolation because percolation occurs by accumulation of the fillers along the edges of the deformed polymer matrix particles. In this paper, electrostatic force microscopy (EFM) and conductive atomic force microscopy (C-AFM) were used to confirm the location of the nanosize fillers and the corresponding percolating paths in polymethyl methacrylate/carbon black composites. The EFM and C-AFM images revealed that the polyhedral polymer particles were coated with filler, primarily on the edges as predicted by the geometric models provided.

Original languageEnglish
Article number233122
JournalApplied Physics Letters
Volume95
Issue number23
DOIs
StatePublished - 2009

Funding

Research funding from the National Science Foundation under Grant Nos. DMR-0076153 and DMR-0604211 is gratefully acknowledged. A portion of this research, conducted at Oak Ridge National Laboratory’s Center for Nanophase Material Sciences, was sponsored by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy.

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