Detecting Trace Boron Doped in Tungsten Plates Using ToF-SIMS, Raman, and SEM

Xiao Ying Yu, Tim Graening, Guang Yang, Tanguy Terlier, Gabriel Parker, Yutai Katoh

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)178-179
Number of pages2
JournalMicroscopy and Microanalysis
Volume30
Issue number2024
DOIs
StatePublished - Jul 24 2024
Event82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States
Duration: Jul 28 2024Aug 1 2024

Funding

We acknowledge support from the Oak Ridge National Laboratory (ORNL) Strategic Laboratory Directed Research and Development (LDRD) fund. ORNL is operated by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 for the U.S. Department of Energy. Pacific Northwest National Laboratory (PNNL) is operated by Battelle under the contract DE-AC05-76RL01830. The United States (US) Government retains and the publisher, by accepting the article for publication, acknowledges that the US Government retains a non-exclusive, paid-up, irrevocable, worldwide license to publish or reproduce the published form of this manuscript, or allow others to do so, for US Government purposes. The DOE will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/doe-public-access-plan).

Cite this