Abstract
Although magnetism originates at the atomic scale, the existing spectroscopic techniques sensitive to magnetic signals only produce spectra with spatial resolution on a larger scale. However, recently, it has been theoretically argued that atomic size electron probes with customized phase distributions can detect magnetic circular dichroism. Here, we report a direct experimental real-space detection of magnetic circular dichroism in aberration-corrected scanning transmission electron microscopy (STEM). Using an atomic size-aberrated electron probe with a customized phase distribution, we reveal the checkerboard antiferromagnetic ordering of Mn moments in LaMnAsO by observing a dichroic signal in the Mn L-edge. The novel experimental setup presented here, which can easily be implemented in aberration-corrected STEM, opens new paths for probing dichroic signals in materials with unprecedented spatial resolution.
Original language | English |
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Article number | 5 |
Journal | Advanced Structural and Chemical Imaging |
Volume | 2 |
Issue number | 1 |
DOIs | |
State | Published - Jan 1 2016 |
Funding
This research was supported by the Center for Nanophase Materials Sciences (CNMS), which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy (JCI), by the Swedish Research Council, Göran Gustafsson Foundation and Swedish National Infrastructure for Computing (NSC center) (JR), and by the Materials Sciences and Engineering Division Office of Basic Energy Sciences, U.S. Department of Energy (MAM, CC, ARL), and by UT-Battelle, LLC, under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy (CTS, RRV). Helpful discussions on correlated noise with B. Violinist and T. Kuula, on EELS data analysis and EMCD with Maria Varela, Wu Zhou and Kristiaan Pelckmans, and on setting up aberrated probes in the electron microscope with Niklas Dellby are gratefully acknowledged. The authors would like to specially thank Ondrej Krivanek and Niklas Dellby for discussions on electron microscopy, and for introducing the authors (JCI, JR, and ARL) during Nion’s organized Swift Workshop in March 2014. Without their intervention this manuscript would not have been possible.
Funders | Funder number |
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Center for Nanophase Materials Sciences | |
Materials Sciences and Engineering Division Office of Basic Energy Sciences | |
Scientific User Facilities Division | |
Swedish National Infrastructure for Computing | |
U.S. Department of Energy | |
Basic Energy Sciences | |
Oak Ridge National Laboratory | |
Canadian Thoracic Society | |
Göran Gustafssons Stiftelser | |
UT-Battelle | DE-AC05-00OR22725 |
National Science Council | |
Jingdezhen Ceramic Institute | |
Vetenskapsrådet |
Keywords
- Aberrated probes
- Aberration correction
- EELS
- EMCD
- STEM
- Vortex beams