Detecting magnetic ordering with atomic size electron probes

Juan Carlos Idrobo, Ján Rusz, Jakob Spiegelberg, Michael A. McGuire, Christopher T. Symons, Ranga Raju Vatsavai, Claudia Cantoni, Andrew R. Lupini

Research output: Contribution to journalArticlepeer-review

35 Scopus citations

Abstract

Although magnetism originates at the atomic scale, the existing spectroscopic techniques sensitive to magnetic signals only produce spectra with spatial resolution on a larger scale. However, recently, it has been theoretically argued that atomic size electron probes with customized phase distributions can detect magnetic circular dichroism. Here, we report a direct experimental real-space detection of magnetic circular dichroism in aberration-corrected scanning transmission electron microscopy (STEM). Using an atomic size-aberrated electron probe with a customized phase distribution, we reveal the checkerboard antiferromagnetic ordering of Mn moments in LaMnAsO by observing a dichroic signal in the Mn L-edge. The novel experimental setup presented here, which can easily be implemented in aberration-corrected STEM, opens new paths for probing dichroic signals in materials with unprecedented spatial resolution.

Original languageEnglish
Article number5
JournalAdvanced Structural and Chemical Imaging
Volume2
Issue number1
DOIs
StatePublished - Jan 1 2016

Funding

This research was supported by the Center for Nanophase Materials Sciences (CNMS), which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy (JCI), by the Swedish Research Council, Göran Gustafsson Foundation and Swedish National Infrastructure for Computing (NSC center) (JR), and by the Materials Sciences and Engineering Division Office of Basic Energy Sciences, U.S. Department of Energy (MAM, CC, ARL), and by UT-Battelle, LLC, under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy (CTS, RRV). Helpful discussions on correlated noise with B. Violinist and T. Kuula, on EELS data analysis and EMCD with Maria Varela, Wu Zhou and Kristiaan Pelckmans, and on setting up aberrated probes in the electron microscope with Niklas Dellby are gratefully acknowledged. The authors would like to specially thank Ondrej Krivanek and Niklas Dellby for discussions on electron microscopy, and for introducing the authors (JCI, JR, and ARL) during Nion’s organized Swift Workshop in March 2014. Without their intervention this manuscript would not have been possible.

FundersFunder number
Center for Nanophase Materials Sciences
Materials Sciences and Engineering Division Office of Basic Energy Sciences
Scientific User Facilities Division
Swedish National Infrastructure for Computing
U.S. Department of Energy
Basic Energy Sciences
Oak Ridge National Laboratory
Canadian Thoracic Society
Göran Gustafssons Stiftelser
UT-BattelleDE-AC05-00OR22725
National Science Council
Jingdezhen Ceramic Institute
Vetenskapsrådet

    Keywords

    • Aberrated probes
    • Aberration correction
    • EELS
    • EMCD
    • STEM
    • Vortex beams

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