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Design, characterization, and performance of a hard x-ray transmission microscope at the National Synchrotron Light Source II 18-ID beamline

  • David Scott Coburn
  • , Evgeny Nazaretski
  • , Weihe Xu
  • , Mingyuan Ge
  • , Cindy Longo
  • , Huijuan Xu
  • , Kazimierz Gofron
  • , Zhijian Yin
  • , Huang Han Chen
  • , Yeukuang Hwu
  • , Wah Keat Lee

Research output: Contribution to journalArticlepeer-review

33 Scopus citations

Abstract

A transmission X-ray microscope has been designed and commissioned at the 18-ID Full-field X-ray Imaging beamline at the National Synchrotron Light Source II. This instrument operates in the 5-11 keV range, and, with the current set of optics, is capable of 30 nm spatial resolution imaging, with a field of view of about 40 μm. For absorption contrast, the minimum exposure time for a single projection image is about 20 ms and an entire 3D tomography data set can be acquired in under 1 min. The system enables tomographic reconstructions with sub-50 nm spatial resolution without the use of markers on the sample or corrections for rotation run-outs.

Original languageEnglish
Article number053701
JournalReview of Scientific Instruments
Volume90
Issue number5
DOIs
StatePublished - May 1 2019
Externally publishedYes

Funding

This research used the 18-ID (FXI) beamline of the National Synchrotron Light Source II, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by the Brookhaven National Laboratory under Contract No. DE-SC0012704. The authors also acknowledge useful discussions with Vincent de Andrade and Francesco De Carlo of the Advanced Photon Source at the Argonne National Laboratory.

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