Design and test of copper Printed RF cavities

Christopher Nantista, Diana Gamzina, Christopher Ledford, Timothy Horn, Paul Carriere, Pedro Frigola

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Additive manufacturing of high-quality copper using electron beam melting techniques has demonstrated significant progress toward suitability for production of vacuum electronics components. Additively manufactured low oxygen level copper wafers, as printed and annealed, have been tested in an RF cavity designed for surface resistivity measurements. Strings of coupled cavities for S-band and X-band traveling wave tubes have been designed for vertical additive manufacturing in powder bed systems, enabling significant cost reduction. The S-band RF cavity string design has been additively manufactured, processed and RF tested.

Original languageEnglish
Title of host publication2020 IEEE 21st International Conference on Vacuum Electronics, IVEC 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages149-150
Number of pages2
ISBN (Electronic)9781538682883
DOIs
StatePublished - Oct 19 2020
Externally publishedYes
Event21st IEEE International Conference on Vacuum Electronics, IVEC 2020 - Monterey, United States
Duration: Oct 19 2020Oct 22 2020

Publication series

Name2020 IEEE 21st International Conference on Vacuum Electronics, IVEC 2020

Conference

Conference21st IEEE International Conference on Vacuum Electronics, IVEC 2020
Country/TerritoryUnited States
CityMonterey
Period10/19/2010/22/20

Funding

The authors would like to acknowledge contributions from Dr. Yuan Zheng and Prof. Neville C. Luhmann from UC Davis; Chris Pearson and Andy Nguyen from SLAC, the NCSU team and the Radiabeam team. This work has been funded by the Naval Sea Systems Command, Crane Division. (Contract no. N68335-18-C-0103).

Keywords

  • Additive manufacturing
  • Design for additive manufacturing
  • Oxygen free high-conductivity copper
  • RF cavities

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