Design and TCAD simulations of planar active-edge pixel sensors for future XFEL applications

Gian Franco Dalla Betta; Giovanni Batignani; Mohamed El Amine Benkechkache; Stefano Bettarini; Giulia Casarosa; Daniele Comotti; Lorenzo Fabris; Francesco Forti; Marco Grassi; Saida Latreche-Lassoued; Luca Lodola; Piero Malcovati; Massimo Manghisoni; Roberto Mendicino; Fabio Morsani; Antonio Paladino; Lucio Pancheri; Eugenio Paoloni; Lodovico Ratti; Valerio Re; Giuliana Rizzo; Gianluca Traversi; Carla Vacchi; Giovanni Verzellesi; Hesong Xu

doi:10.1109/NSSMIC.2014.7431078

Design and TCAD simulations of planar active-edge pixel sensors for future XFEL applications

Gian Franco Dalla Betta, Giovanni Batignani, Mohamed El Amine Benkechkache, Stefano Bettarini, Giulia Casarosa, Daniele Comotti, Lorenzo Fabris, Francesco Forti, Marco Grassi, Saida Latreche-Lassoued, Luca Lodola, Piero Malcovati, Massimo Manghisoni, Roberto Mendicino, Fabio Morsani, Antonio Paladino, Lucio Pancheri, Eugenio Paoloni, Lodovico Ratti, Valerio ReGiuliana Rizzo, Gianluca Traversi, Carla Vacchi, Giovanni Verzellesi, Hesong Xu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

Abstract

We report on the design and TCAD simulations of planar active-edge pixel sensors within the INFN PixFEL project. These devices are intended as one of the building blocks for the assembly of a multilayer, four-side buttable tile for X-ray imaging applications in future Free Electron Laser facilities. The requirements in terms of very wide dynamic range and tolerance to extremely high ionizing radiation doses call for high operation voltages. A comprehensive TCAD simulation study is presented, aimed at the best trade-offs between the minimization of the edge region size and the sensor breakdown voltage.

Original language	English
Title of host publication	2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781479960972
DOIs	https://doi.org/10.1109/NSSMIC.2014.7431078
State	Published - Mar 10 2016
Externally published	Yes
Event	IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014 - Seattle, United States Duration: Nov 8 2014 → Nov 15 2014

Publication series

Name	2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014

Conference

Conference	IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014
Country/Territory	United States
City	Seattle
Period	11/8/14 → 11/15/14

Bibliographical note

Publisher Copyright:
© 2014 IEEE.

Access to Document

10.1109/NSSMIC.2014.7431078

Cite this

Dalla Betta, G. F., Batignani, G., Benkechkache, M. E. A., Bettarini, S., Casarosa, G., Comotti, D., Fabris, L., Forti, F., Grassi, M., Latreche-Lassoued, S., Lodola, L., Malcovati, P., Manghisoni, M., Mendicino, R., Morsani, F., Paladino, A., Pancheri, L., Paoloni, E., Ratti, L., ... Xu, H. (2016). Design and TCAD simulations of planar active-edge pixel sensors for future XFEL applications. In 2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014 Article 7431078 (2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSSMIC.2014.7431078

Dalla Betta, Gian Franco ; Batignani, Giovanni ; Benkechkache, Mohamed El Amine et al. / Design and TCAD simulations of planar active-edge pixel sensors for future XFEL applications. 2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014. Institute of Electrical and Electronics Engineers Inc., 2016. (2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014).

@inproceedings{debbd78b9e044715bd86acef4b650b64,

title = "Design and TCAD simulations of planar active-edge pixel sensors for future XFEL applications",

abstract = "We report on the design and TCAD simulations of planar active-edge pixel sensors within the INFN PixFEL project. These devices are intended as one of the building blocks for the assembly of a multilayer, four-side buttable tile for X-ray imaging applications in future Free Electron Laser facilities. The requirements in terms of very wide dynamic range and tolerance to extremely high ionizing radiation doses call for high operation voltages. A comprehensive TCAD simulation study is presented, aimed at the best trade-offs between the minimization of the edge region size and the sensor breakdown voltage.",

author = "{Dalla Betta}, {Gian Franco} and Giovanni Batignani and Benkechkache, {Mohamed El Amine} and Stefano Bettarini and Giulia Casarosa and Daniele Comotti and Lorenzo Fabris and Francesco Forti and Marco Grassi and Saida Latreche-Lassoued and Luca Lodola and Piero Malcovati and Massimo Manghisoni and Roberto Mendicino and Fabio Morsani and Antonio Paladino and Lucio Pancheri and Eugenio Paoloni and Lodovico Ratti and Valerio Re and Giuliana Rizzo and Gianluca Traversi and Carla Vacchi and Giovanni Verzellesi and Hesong Xu",

note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014 ; Conference date: 08-11-2014 Through 15-11-2014",

year = "2016",

month = mar,

day = "10",

doi = "10.1109/NSSMIC.2014.7431078",

language = "English",

series = "2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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Dalla Betta, GF, Batignani, G, Benkechkache, MEA, Bettarini, S, Casarosa, G, Comotti, D, Fabris, L, Forti, F, Grassi, M, Latreche-Lassoued, S, Lodola, L, Malcovati, P, Manghisoni, M, Mendicino, R, Morsani, F, Paladino, A, Pancheri, L, Paoloni, E, Ratti, L, Re, V, Rizzo, G, Traversi, G, Vacchi, C, Verzellesi, G & Xu, H 2016, Design and TCAD simulations of planar active-edge pixel sensors for future XFEL applications. in 2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014., 7431078, 2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014, Institute of Electrical and Electronics Engineers Inc., IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014, Seattle, United States, 11/8/14. https://doi.org/10.1109/NSSMIC.2014.7431078

Design and TCAD simulations of planar active-edge pixel sensors for future XFEL applications. / Dalla Betta, Gian Franco; Batignani, Giovanni; Benkechkache, Mohamed El Amine et al.
2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014. Institute of Electrical and Electronics Engineers Inc., 2016. 7431078 (2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Design and TCAD simulations of planar active-edge pixel sensors for future XFEL applications

AU - Dalla Betta, Gian Franco

AU - Batignani, Giovanni

AU - Benkechkache, Mohamed El Amine

AU - Bettarini, Stefano

AU - Casarosa, Giulia

AU - Comotti, Daniele

AU - Fabris, Lorenzo

AU - Forti, Francesco

AU - Grassi, Marco

AU - Latreche-Lassoued, Saida

AU - Lodola, Luca

AU - Malcovati, Piero

AU - Manghisoni, Massimo

AU - Mendicino, Roberto

AU - Morsani, Fabio

AU - Paladino, Antonio

AU - Pancheri, Lucio

AU - Paoloni, Eugenio

AU - Ratti, Lodovico

AU - Re, Valerio

AU - Rizzo, Giuliana

AU - Traversi, Gianluca

AU - Vacchi, Carla

AU - Verzellesi, Giovanni

AU - Xu, Hesong

PY - 2016/3/10

Y1 - 2016/3/10

N2 - We report on the design and TCAD simulations of planar active-edge pixel sensors within the INFN PixFEL project. These devices are intended as one of the building blocks for the assembly of a multilayer, four-side buttable tile for X-ray imaging applications in future Free Electron Laser facilities. The requirements in terms of very wide dynamic range and tolerance to extremely high ionizing radiation doses call for high operation voltages. A comprehensive TCAD simulation study is presented, aimed at the best trade-offs between the minimization of the edge region size and the sensor breakdown voltage.

AB - We report on the design and TCAD simulations of planar active-edge pixel sensors within the INFN PixFEL project. These devices are intended as one of the building blocks for the assembly of a multilayer, four-side buttable tile for X-ray imaging applications in future Free Electron Laser facilities. The requirements in terms of very wide dynamic range and tolerance to extremely high ionizing radiation doses call for high operation voltages. A comprehensive TCAD simulation study is presented, aimed at the best trade-offs between the minimization of the edge region size and the sensor breakdown voltage.

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U2 - 10.1109/NSSMIC.2014.7431078

DO - 10.1109/NSSMIC.2014.7431078

M3 - Conference contribution

AN - SCOPUS:84965020690

T3 - 2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014

BT - 2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014

Y2 - 8 November 2014 through 15 November 2014

ER -

Dalla Betta GF, Batignani G, Benkechkache MEA, Bettarini S, Casarosa G, Comotti D et al. Design and TCAD simulations of planar active-edge pixel sensors for future XFEL applications. In 2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014. Institute of Electrical and Electronics Engineers Inc. 2016. 7431078. (2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014). doi: 10.1109/NSSMIC.2014.7431078

Design and TCAD simulations of planar active-edge pixel sensors for future XFEL applications

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