TY - JOUR
T1 - Depth-resolved magnetic and structural analysis of relaxing epitaxial Sr2CrReO6
AU - Lucy, J. M.
AU - Hauser, A. J.
AU - Liu, Y.
AU - Zhou, H.
AU - Choi, Y.
AU - Haskel, D.
AU - Te Velthuis, S. G.E.
AU - Yang, F. Y.
N1 - Publisher Copyright:
© 2015 American Physical Society.
PY - 2015/3/16
Y1 - 2015/3/16
N2 - Structural relaxation in a Sr2CrReO6 epitaxial film, which exhibits strong spin-orbit coupling, leads to depth-dependent magnetism. We combine two depth-resolved synchrotron x-ray techniques - two-dimensional reciprocal space mapping and x-ray magnetic circular dichroism - to quantitatively determine this effect. An 800-nm-thick film of Sr2CrReO6, grown with tensile epitaxial strain on SrCr0.5Nb0.5O3(225nm)/(LaAlO3)0.3(Sr2AlTaO6)0.7, relaxes away from the Sr2CrReO6/SrCr0.5Nb0.5O3 interface to its bulk lattice parameters, with much of the film being fully relaxed. Grazing incidence x-ray diffraction of the film elucidates the in-plane strain relaxation near the film-substrate interface, while depth-resolved x-ray magnetic circular dichroism at the Re L edge reveals the magnetic contributions of the Re site. The smooth relaxation of the film near the interface correlates with changes in the magnetic anisotropy. This provides a systematic and powerful way to probe the depth-varying structural and magnetic properties of a complex oxide with synchrotron-source x-ray techniques.
AB - Structural relaxation in a Sr2CrReO6 epitaxial film, which exhibits strong spin-orbit coupling, leads to depth-dependent magnetism. We combine two depth-resolved synchrotron x-ray techniques - two-dimensional reciprocal space mapping and x-ray magnetic circular dichroism - to quantitatively determine this effect. An 800-nm-thick film of Sr2CrReO6, grown with tensile epitaxial strain on SrCr0.5Nb0.5O3(225nm)/(LaAlO3)0.3(Sr2AlTaO6)0.7, relaxes away from the Sr2CrReO6/SrCr0.5Nb0.5O3 interface to its bulk lattice parameters, with much of the film being fully relaxed. Grazing incidence x-ray diffraction of the film elucidates the in-plane strain relaxation near the film-substrate interface, while depth-resolved x-ray magnetic circular dichroism at the Re L edge reveals the magnetic contributions of the Re site. The smooth relaxation of the film near the interface correlates with changes in the magnetic anisotropy. This provides a systematic and powerful way to probe the depth-varying structural and magnetic properties of a complex oxide with synchrotron-source x-ray techniques.
UR - https://www.scopus.com/pages/publications/84925879324
U2 - 10.1103/PhysRevB.91.094413
DO - 10.1103/PhysRevB.91.094413
M3 - Article
AN - SCOPUS:84925879324
SN - 1098-0121
VL - 91
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 9
M1 - 094413
ER -