TY - JOUR
T1 - Deposition of zinc oxide photoelectrode using plasma enhanced chemical vapor deposition for dye-sensitized solar cells
AU - Lee, Su Young
AU - Kim, Sang Ho
N1 - Publisher Copyright:
Copyright © 2014 American Scientific Publishers.
PY - 2014/12/1
Y1 - 2014/12/1
N2 - We investigated the characteristics of zinc oxide (ZnO) photoelectrodes grown by plasma enhanced chemical vapor deposition. ZnO has many advantages, such as high binding energy, breakdown strength, cohesion, hardness, and electron mobility. On the F-doped SnO2 (FTO) electrode, we deposited ZnO as a function of thickness, and we examined the thickness effect on the I-V, fill factor, open-circuit voltage, short-circuit current density, and especially the power conversion efficiency of the built in dye-sensitized solar cell. To study the thickness effect on the conduction and recombination of electrons in the ZnO electrode, we analyzed the alignment of grains, crystallinity, impedance, and cyclic I-V properties. The thickness of ZnO changed the electron diffusion length and recombination time. As a result, the maximum power conversion efficiency of 2.63% was obtained with a moderately thick (8.06 μm) ZnO.
AB - We investigated the characteristics of zinc oxide (ZnO) photoelectrodes grown by plasma enhanced chemical vapor deposition. ZnO has many advantages, such as high binding energy, breakdown strength, cohesion, hardness, and electron mobility. On the F-doped SnO2 (FTO) electrode, we deposited ZnO as a function of thickness, and we examined the thickness effect on the I-V, fill factor, open-circuit voltage, short-circuit current density, and especially the power conversion efficiency of the built in dye-sensitized solar cell. To study the thickness effect on the conduction and recombination of electrons in the ZnO electrode, we analyzed the alignment of grains, crystallinity, impedance, and cyclic I-V properties. The thickness of ZnO changed the electron diffusion length and recombination time. As a result, the maximum power conversion efficiency of 2.63% was obtained with a moderately thick (8.06 μm) ZnO.
KW - Dssc
KW - Pecvd
KW - Photo eectrode
KW - Zno
UR - http://www.scopus.com/inward/record.url?scp=84911406278&partnerID=8YFLogxK
U2 - 10.1166/jnn.2014.10136
DO - 10.1166/jnn.2014.10136
M3 - Article
AN - SCOPUS:84911406278
SN - 1533-4880
VL - 14
SP - 9272
EP - 9278
JO - Journal of Nanoscience and Nanotechnology
JF - Journal of Nanoscience and Nanotechnology
IS - 12
ER -