Deposition of biaxially-oriented metal and oxide buffer-layer films on textured Ni tapes: New substrates for high-current, high-temperature superconductors

Qing He, D. K. Christen, J. D. Budai, E. D. Specht, D. F. Lee, A. Goyal, D. P. Norton, M. Paranthaman, F. A. List, D. M. Kroeger

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Abstract

Techniques are reported for sputter deposition of biaxially oriented buffer-layers on textured Ni tapes. These buffered tapes can be employed as long, flexible, or large area substrates for biaxially-aligned high-temperature superconductors (HTS) with high critical current density Jc. Using deposition techniques at temperatures as low as 25°C, epitaxial Pd or Pt films were first deposited as a base layer on the textured Ni tapes, followed by deposition of biaxially oriented Ag or CeO2 buffer layers. Using Ar/4%H2 sputter gas, biaxially oriented CeO2 films were also grown directly on the textured Ni tapes, followed by the epitaxial growth of YSZ films. All the films show both strong in-plane and out-of-plane orientations. The effects of Ni surface smoothness on buffer-layer texture were also investigated.

Original languageEnglish
Pages (from-to)155-161
Number of pages7
JournalPhysica C: Superconductivity and its Applications
Volume275
Issue number1-2
DOIs
StatePublished - Feb 10 1997

Funding

The authors would like to thank the useful discussions with and encouragement from R.A. Hawsey, J.R. Thompson and A.J. Pedraza. Research was cosponsored by the DOE Division of Materials Sciences and by the DOE Office of Advanced Utility Concepts, Superconductivity Technology Program, both under Contract No. DE-AC05-84OR21400 with Lockheed Martin Energy Research Corporation.

FundersFunder number
DOE Division of Materials Sciences
DOE Office of Advanced Utility Concepts
Superconductivity Technology Program

    Keywords

    • Applications of high-T superconductors
    • Grain alignment (texturing)
    • Multilayers
    • Thin films

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