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Dive into the research topics of 'Dependence on proton energy of degradation of AlGaN/GaN high electron mobility transistors'. Together they form a unique fingerprint.- Sort by
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Lu Liu, Chien Fong Lo, Yuyin Xi, Yuxi Wang, Fan Ren, Stephen J. Pearton, Hong Yeol Kim, Jihyun Kim, Robert C. Fitch, Dennis E. Walker, Kelson D. Chabak, James K. Gillespie, Stephen E. Tetlak, Glen D. Via, Antonio Crespo, Ivan I. Kravchenko
Research output: Contribution to journal › Article › peer-review