Dependence on proton energy of degradation of AlGaN/GaN high electron mobility transistors

Lu Liu, Chien Fong Lo, Yuyin Xi, Yuxi Wang, Fan Ren, Stephen J. Pearton, Hong Yeol Kim, Jihyun Kim, Robert C. Fitch, Dennis E. Walker, Kelson D. Chabak, James K. Gillespie, Stephen E. Tetlak, Glen D. Via, Antonio Crespo, Ivan I. Kravchenko

Research output: Contribution to journal › Article › peer-review

41 Scopus citations

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