Defining HRTEM rsolution: Why youngs fringes don't measure resolution

Michael A. O'Keefe, Lawrence F. Allard, Douglas A. Blom

Research output: Contribution to journalArticlepeer-review

6 Scopus citations
Original languageEnglish
Pages (from-to)1470-1471
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 2009

Funding

[1] M.A. O'Keefe, LBL Symposium on Microstructures of Materials, ed. K. Krishnan (1993) 121-126. [2] Lord Rayleigh, Philosophical Magazine 47 (1874) 81. [3] M. A. O’Keefe, L.F. Allard & D. A. Blom, J. Electron Microscopy 54 (2005) 169-180. [4] M. A. O’Keefe, L.F. Allard & D. A. Blom, Microscopy & Microanalysis 11 S02 (2005) 540-541. [5] M.A. O’Keefe, E.C. Nelson, Y.C. Wang & A. Thust, Philosophical Mag. B 81 (2001) 1861-1878. [6] M.A. O’Keefe, Ultramicroscopy 108 (2008) 196–209. [7] H. Sawada et al, Microscopy & Microanalysis 13 S02 (2007) 880-881. [8] M.A. O'Keefe, 37th Ann. Proc. EMSA, San Antonio, Texas (1979) 556-557. [9] S. Kujawa et al., Microscopy & Microanalysis 12 S02 (2006) 1470-1471. [10] M. A. O’Keefe, L.F. Allard & D. A. Blom, Microscopy & Microanalysis 14 S02 (2008) 834-835. [11] J. Barthel & A. Thust, Phys. Rev. Letts. 101 (2008) 200801. [12] A.C. Diebold et al., Microscopy & Microanalysis 9 (2003) 493–508. [13] A.C. Diebold et al., Microscopy & Microanalysis 10 (2004) 399-400. [14] C. Kisielowski, OÅM report (2004). [15] M.A. O’Keefe et al., Ultramicroscopy 89 (2001) 215–241. [16] Research at Oak Ridge National Laboratory's High Temperature Materials Laboratory sponsored by U.S. Department of Energy, Office of Energy Efficiency and Renewable Energy, Vehicle Technologies program.

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