Defective Interfaces in Yttrium-Doped Barium Zirconate Films and Consequences on Proton Conduction

Nan Yang, Claudia Cantoni, Vittorio Foglietti, Antonello Tebano, Alex Belianinov, Evgheni Strelcov, Stephen Jesse, Daniele Di Castro, Elisabetta Di Bartolomeo, Silvia Licoccia, Sergei V. Kalinin, Giuseppe Balestrino, Carmela Aruta

Research output: Contribution to journalArticlepeer-review

26 Scopus citations

Abstract

Yttrium-doped barium zirconate (BZY) thin films recently showed surprising electric transport properties. Experimental investigations conducted mainly by electrochemical impedance spectroscopy suggested that a consistent part of this BZY conductivity is of protonic nature. These results have stimulated further investigations by local unconventional techniques. Here, we use electrochemical strain microscopy (ESM) to detect electrochemical activity in BZY films with nanoscale resolution. ESM in a novel cross-sectional measuring setup allows the direct visualization of the interfacial activity. The local electrochemical investigation is compared with the structural studies performed by state of art scanning transmission electron microscopy (STEM). The ESM and STEM results show a clear correlation between the conductivity and the interface structural defects. We propose a physical model based on a misfit dislocation network that introduces a novel 2D transport phenomenon, whose fingerprint is the low activation energy measured. (Figure Presented).

Original languageEnglish
Pages (from-to)2343-2349
Number of pages7
JournalNano Letters
Volume15
Issue number4
DOIs
StatePublished - Apr 8 2015

Funding

FundersFunder number
Basic Energy Sciences
U.S. Department of Energy

    Keywords

    • SPM
    • STEM
    • doped barium zirconate
    • electrolytes
    • interface defects
    • ionic conduction
    • perovskite oxide thin films

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