Deep learning of interface structures from simulated 4D STEM data: Cation intermixing vs. roughening

M. P. Oxley, J. Yin, N. Borodinov, S. Somnath, M. Ziatdinov, A. R. Lupini, S. Jesse, R. K. Vasudevan, S. V. Kalinin

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

Interface structures in complex oxides remain an active area of condensed matter physics research, largely enabled by recent advances in scanning transmission electron microscopy (STEM). Yet the nature of the STEM contrast in which the structure is projected along the given direction precludes separation of possible structural models. Here, we utilize deep convolutional neural networks (DCNN) trained on simulated 4D STEM datasets to predict structural descriptors of interfaces. We focus on the widely studied interface between LaAlO3 and SrTiO3, using dynamical diffraction theory and leveraging high performance computing to simulate thousands of possible 4D STEM datasets to train the DCNN to learn properties of the underlying structures on which the simulations are based. We test the DCNN on simulated data and show that it is possible (with >95% accuracy) to identify a physically rough from a chemically diffuse interface and create a DCNN regression model to predict step positions. We quantify the applicability of the model to different thicknesses and the transferability of the approach. The method shown here is general and can be applied for any inverse imaging problem where forward models are present.

Original languageEnglish
Article numberaba32d
JournalMachine Learning: Science and Technology
Volume1
Issue number4
DOIs
StatePublished - Dec 2020

Bibliographical note

Publisher Copyright:
© 2020 The Author(s). Published by IOP Publishing Ltd

Keywords

  • Deep learning
  • Inverse problem
  • Oxide interface
  • Scanning transmission electron microscopy

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