Decoupling of superposed textures in an electrically biased piezoceramic with a 100 preferred orientation

Chris M. Fancher; John E. Blendell; Keith J. Bowman

doi:10.1063/1.4976009

Decoupling of superposed textures in an electrically biased piezoceramic with a 100 preferred orientation

Chris M. Fancher, John E. Blendell, Keith J. Bowman

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

A method leveraging Rietveld full-pattern texture analysis to decouple induced domain texture from a preferred grain orientation is presented. The proposed method is demonstrated by determining the induced domain texture in a polar polymorph of 100 oriented 0.91Bi_1/2Na_1/2TiO₃-0.07BaTiO₃-0.02K_0.5Na_0.5NbO₃. Domain textures determined using the present method are compared with results obtained via single peak fitting. Texture determined using single peak fitting estimated more domain alignment than that determined using the Rietveld based method. These results suggest that the combination of grain texture and phase transitions can lead to single peak fitting under or over estimating domain texture. While demonstrated for a bulk piezoelectric, the proposed method can be applied to quantify domain textures in multi-component systems and thin films.

Original language	English
Article number	062901
Journal	Applied Physics Letters
Volume	110
Issue number	6
DOIs	https://doi.org/10.1063/1.4976009
State	Published - Feb 6 2017
Externally published	Yes

Funding

This work was supported by the U.S. National Science Foundation under Grant No. DMR 0805022. The use of the Advanced Photon Source was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.

Funders	Funder number
National Science Foundation	DMR 0805022
U.S. Department of Energy
Office of Science
Basic Energy Sciences	DE-AC02-06CH11357

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10.1063/1.4976009

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title = "Decoupling of superposed textures in an electrically biased piezoceramic with a 100 preferred orientation",

abstract = "A method leveraging Rietveld full-pattern texture analysis to decouple induced domain texture from a preferred grain orientation is presented. The proposed method is demonstrated by determining the induced domain texture in a polar polymorph of 100 oriented 0.91Bi1/2Na1/2TiO3-0.07BaTiO3-0.02K0.5Na0.5NbO3. Domain textures determined using the present method are compared with results obtained via single peak fitting. Texture determined using single peak fitting estimated more domain alignment than that determined using the Rietveld based method. These results suggest that the combination of grain texture and phase transitions can lead to single peak fitting under or over estimating domain texture. While demonstrated for a bulk piezoelectric, the proposed method can be applied to quantify domain textures in multi-component systems and thin films.",

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AU - Blendell, John E.

AU - Bowman, Keith J.

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AB - A method leveraging Rietveld full-pattern texture analysis to decouple induced domain texture from a preferred grain orientation is presented. The proposed method is demonstrated by determining the induced domain texture in a polar polymorph of 100 oriented 0.91Bi1/2Na1/2TiO3-0.07BaTiO3-0.02K0.5Na0.5NbO3. Domain textures determined using the present method are compared with results obtained via single peak fitting. Texture determined using single peak fitting estimated more domain alignment than that determined using the Rietveld based method. These results suggest that the combination of grain texture and phase transitions can lead to single peak fitting under or over estimating domain texture. While demonstrated for a bulk piezoelectric, the proposed method can be applied to quantify domain textures in multi-component systems and thin films.

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Decoupling of superposed textures in an electrically biased piezoceramic with a 100 preferred orientation

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