Decoupling of superposed textures in an electrically biased piezoceramic with a 100 preferred orientation

Chris M. Fancher, John E. Blendell, Keith J. Bowman

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6 Scopus citations

Abstract

A method leveraging Rietveld full-pattern texture analysis to decouple induced domain texture from a preferred grain orientation is presented. The proposed method is demonstrated by determining the induced domain texture in a polar polymorph of 100 oriented 0.91Bi1/2Na1/2TiO3-0.07BaTiO3-0.02K0.5Na0.5NbO3. Domain textures determined using the present method are compared with results obtained via single peak fitting. Texture determined using single peak fitting estimated more domain alignment than that determined using the Rietveld based method. These results suggest that the combination of grain texture and phase transitions can lead to single peak fitting under or over estimating domain texture. While demonstrated for a bulk piezoelectric, the proposed method can be applied to quantify domain textures in multi-component systems and thin films.

Original languageEnglish
Article number062901
JournalApplied Physics Letters
Volume110
Issue number6
DOIs
StatePublished - Feb 6 2017
Externally publishedYes

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Publisher Copyright:
© 2017 Author(s).

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