Abstract
While machine learning has been making enormous strides in many technical areas, it is still massively underused in transmission electron microscopy. To address this, a convolutional neural network model was developed for reliable classification of crystal structures from small numbers of electron images and diffraction patterns with no preferred orientation. Diffraction data containing 571,340 individual crystals divided among seven families, 32 genera, and 230 space groups were used to train the network. Despite the highly imbalanced dataset, the network narrows down the space groups to the top two with over 70% confidence in the worst case and up to 95% in the common cases. As examples, we benchmarked against alloys to two-dimensional materials to cross-validate our deep-learning model against high-resolution transmission electron images and diffraction patterns. We present this result both as a research tool and deep-learning application for diffraction analysis.
Original language | English |
---|---|
Article number | eaaw1949 |
Journal | Science Advances |
Volume | 5 |
Issue number | 10 |
DOIs | |
State | Published - Oct 30 2019 |
Funding
We thank I. Harvey for the many useful discussions and contributions to this work. M. Patel and H. Yoon are acknowledged for providing samples and data for analysis. A portion of this research was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility (R.R.U.). We also acknowledge D. Masiel, B. Reed, K. Jungjohann, S. Misra, J. Gu, and R. Mariani for the helpful discussions. This work was supported through the INL Laboratory Directed Research and Development (LDRD) Program under DOE Idaho Operations Office Contract DE-AC07-05ID145142.
Funders | Funder number |
---|---|
DOE Idaho Operations Office | DE-AC07-05ID145142 |
DOE Office of Science user facility | |
Laboratory Directed Research and Development |