Abstract
Organometallic halide perovskites (OHPs) hold great promise for next-generation, low-cost optoelectronic devices. During the chemical synthesis and crystallization of OHP thin films, a major unresolved question is the competition between multiple halide species (e.g., I-, Cl-, Br-) in the formation of the mixed-halide perovskite crystals. Whether Cl- ions are successfully incorporated into the perovskite crystal structure or, alternatively, where they are located is not yet fully understood. Here, in situ X-ray diffraction measurements of crystallization dynamics are combined with ex situ TOF-SIMS chemical analysis to reveal that Br- or Cl- ions can promote crystal growth, yet reactive I- ions prevent them from incorporating into the lattice of the final perovskite crystal structure. The Cl- ions are located in the grain boundaries of the perovskite films. These findings significantly advance our understanding of the role of halogens during synthesis of hybrid perovskites and provide an insightful guidance to the engineering of high-quality perovskite films, essential for exploring superior-performing and cost-effective optoelectronic devices.
Original language | English |
---|---|
Pages (from-to) | 5028-5035 |
Number of pages | 8 |
Journal | Journal of the American Chemical Society |
Volume | 138 |
Issue number | 15 |
DOIs | |
State | Published - May 4 2016 |
Funding
This research was conducted at the Center for Nanophase Materials Sciences (CNMS), which is a DOE Office of Science User Facility. M.H.D.'s work is supported by the Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division. The authors acknowledge Ho Ming Tong for preparation of contour plots (Figure 1b).
Funders | Funder number |
---|---|
U.S. Department of Energy | |
Office of Science | |
Basic Energy Sciences | |
Division of Materials Sciences and Engineering |