Data efficient X-ray phase tomography with self-calibrated sandpaper analyzer

Michael Chen, Dilworth Parkinson, Singanallur Venkatakrishnan, Stefano Marchesini, Laura Waller

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We implement 3D phase tomography on an X-ray computed tomography (CT) beamline by adding a sandpaper analyzer in the Fresnel region. Our algorithm solves for 3D phase directly from the raw intensity measurements, while simultaneously estimating the sandpaper phase. We discuss the use of priors to reduce the number of measurements.

Original languageEnglish
Title of host publicationComputational Optical Sensing and Imaging, COSI 2017
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)9781943580293
ISBN (Print)9781943580293
DOIs
StatePublished - 2017
EventComputational Optical Sensing and Imaging, COSI 2017 - San Francisco, United States
Duration: Jun 26 2017Jun 29 2017

Publication series

NameOptics InfoBase Conference Papers
VolumePart F46-COSI 2017
ISSN (Electronic)2162-2701

Conference

ConferenceComputational Optical Sensing and Imaging, COSI 2017
Country/TerritoryUnited States
CitySan Francisco
Period06/26/1706/29/17

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