Creation of a two-dimensional electron gas at an oxide interface on silicon

J. W. Park, D. F. Bogorin, C. Cen, D. A. Felker, Y. Zhang, C. T. Nelson, C. W. Bark, C. M. Folkman, X. Q. Pan, M. S. Rzchowski, J. Levy, C. B. Eom

Research output: Contribution to journalArticlepeer-review

164 Scopus citations

Abstract

In recent years, reversible control over metal-insulator transition has been shown, at the nanoscale, in a two-dimensional electron gas (2DEG) formed at the interface between two complex oxides. These materials have thus been suggested as possible platforms for developing ultrahigh-density oxide nanoelectronics. A prerequisite for the development of these new technologies is the integration with existing semiconductor electronics platforms. Here, we demonstrate room-temperature conductivity switching of 2DEG nanowires formed at atomically sharp LaAlO3/SrTiO3 (LAO/STO) heterointerfaces grown directly on (001) Silicon (Si) substrates. The room-temperature electrical transport properties of LAO/STO heterointerfaces on Si are comparable with those formed from a SrTiO3 bulk single crystal. The ability to form reversible conducting nanostructures directly on Si wafers opens new opportunities to incorporate ultrahigh-density oxide nanoelectronic memory and logic elements into well-established Si-based platforms.

Original languageEnglish
Article number94
JournalNature Communications
Volume1
Issue number7
DOIs
StatePublished - 2010
Externally publishedYes

Funding

We thank J. Mannhart, S. Thiel and D.G. Schlom for helpful discussions. The authors gratefully acknowledge the financial support of the National Science Foundation through grants DMR-0906443 (C.B.E), DMR-0704022 (J.L.), DARPA Seedling (J.L.), Fine Foundation (J.L.), DMR-0907191 (X.Q.P), DoE/BES DE-FG02-07ER46416 (X.Q.P), Nanochip and David and Lucile Packard Fellowship (C.B.E). One of the authors (X.Q.P) acknowledges the support of the National Center for Electron Microscopy, Lawrence Berkeley Lab, which is supported by the US Department of Energy under Contract # DE-AC02-05CH11231. We thank J. Mannhart, S. Thiel and D.G. Schlom for helpful discussions. The authors gratefully acknowledge the financial support of the National Science Foundation through grants DMR-0906443 (C.B.E.), DMR-0704022 (J.L.), ARO W911NF-08-1-0317 (J.L.), DARPA Seedling (J.L.), Fine Foundation (J.L.), DMR-0907191 (X.Q.P.), DoE/BES DE-FG02-07ER46416 (X.Q.P.), Nanochip and David and Lucile Packard Fellowship (C.B.E.). One of the authors (X.Q.P.) acknowledges the support of the National Center for Electron Microscopy, Lawrence Berkeley Lab, which is supported by the US Department of Energy under Contract # DE-AC02-05CH11231.

FundersFunder number
Fine FoundationDMR-0907191, DoE/BES DE-FG02-07ER46416
National Science FoundationDMR-0906443, ARO W911NF-08-1-0317, DMR-0704022
U.S. Department of EnergyDE-AC02-05CH11231
Defense Advanced Research Projects Agency

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