Abstract
In recent years, reversible control over metal-insulator transition has been shown, at the nanoscale, in a two-dimensional electron gas (2DEG) formed at the interface between two complex oxides. These materials have thus been suggested as possible platforms for developing ultrahigh-density oxide nanoelectronics. A prerequisite for the development of these new technologies is the integration with existing semiconductor electronics platforms. Here, we demonstrate room-temperature conductivity switching of 2DEG nanowires formed at atomically sharp LaAlO3/SrTiO3 (LAO/STO) heterointerfaces grown directly on (001) Silicon (Si) substrates. The room-temperature electrical transport properties of LAO/STO heterointerfaces on Si are comparable with those formed from a SrTiO3 bulk single crystal. The ability to form reversible conducting nanostructures directly on Si wafers opens new opportunities to incorporate ultrahigh-density oxide nanoelectronic memory and logic elements into well-established Si-based platforms.
Original language | English |
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Article number | 94 |
Journal | Nature Communications |
Volume | 1 |
Issue number | 7 |
DOIs | |
State | Published - 2010 |
Externally published | Yes |
Funding
We thank J. Mannhart, S. Thiel and D.G. Schlom for helpful discussions. The authors gratefully acknowledge the financial support of the National Science Foundation through grants DMR-0906443 (C.B.E), DMR-0704022 (J.L.), DARPA Seedling (J.L.), Fine Foundation (J.L.), DMR-0907191 (X.Q.P), DoE/BES DE-FG02-07ER46416 (X.Q.P), Nanochip and David and Lucile Packard Fellowship (C.B.E). One of the authors (X.Q.P) acknowledges the support of the National Center for Electron Microscopy, Lawrence Berkeley Lab, which is supported by the US Department of Energy under Contract # DE-AC02-05CH11231. We thank J. Mannhart, S. Thiel and D.G. Schlom for helpful discussions. The authors gratefully acknowledge the financial support of the National Science Foundation through grants DMR-0906443 (C.B.E.), DMR-0704022 (J.L.), ARO W911NF-08-1-0317 (J.L.), DARPA Seedling (J.L.), Fine Foundation (J.L.), DMR-0907191 (X.Q.P.), DoE/BES DE-FG02-07ER46416 (X.Q.P.), Nanochip and David and Lucile Packard Fellowship (C.B.E.). One of the authors (X.Q.P.) acknowledges the support of the National Center for Electron Microscopy, Lawrence Berkeley Lab, which is supported by the US Department of Energy under Contract # DE-AC02-05CH11231.
Funders | Funder number |
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Fine Foundation | DMR-0907191, DoE/BES DE-FG02-07ER46416 |
National Science Foundation | DMR-0906443, ARO W911NF-08-1-0317, DMR-0704022 |
U.S. Department of Energy | DE-AC02-05CH11231 |
Defense Advanced Research Projects Agency |