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Coupled finite element - Potts model simulations of grain growth in copper interconnects

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    Abstract

    The paper addresses grain growth in copper interconnects in the presence of thermal expansion mismatch stresses. The evolution of grain structure and texture in copper in the simultaneous presence of two driving forces, curvature and elastic stored energy difference, is modeled by using a hybrid Potts model simulation approach. The elastic stored energy is calculated by using the commercial finite element code ABAQUS, where the effect of elastic anisotropy on the thermal mismatch stress and strain distribution within a polycrystalline grain structure is modeled through a user material (UMAT) interface. Parametric studies on the effect of trench width and the height of the overburden were carried out. The results show that the grain structure and texture evolution are significantly altered by the presence of elastic strain energy.

    Original languageEnglish
    Title of host publicationMaterials, Processes, and Reliability for Advanced Interconnects for Micro- and Nanoelectronics - 2009
    PublisherMaterials Research Society
    Pages79-84
    Number of pages6
    ISBN (Print)9781605111292, 9781605111643
    DOIs
    StatePublished - 2009
    Event2009 MRS Spring Meeting - San Francisco, CA, United States
    Duration: Apr 13 2009Apr 17 2009

    Publication series

    NameMaterials Research Society Symposium Proceedings
    Volume1156
    ISSN (Print)0272-9172

    Conference

    Conference2009 MRS Spring Meeting
    Country/TerritoryUnited States
    CitySan Francisco, CA
    Period04/13/0904/17/09

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