TY - GEN
T1 - Coupled finite element - Potts model simulations of grain growth in copper interconnects
AU - Radhakrishnan, Bala
AU - Sarma, Gorti
PY - 2009
Y1 - 2009
N2 - The paper addresses grain growth in copper interconnects in the presence of thermal expansion mismatch stresses. The evolution of grain structure and texture in copper in the simultaneous presence of two driving forces, curvature and elastic stored energy difference, is modeled by using a hybrid Potts model simulation approach. The elastic stored energy is calculated by using the commercial finite element code ABAQUS, where the effect of elastic anisotropy on the thermal mismatch stress and strain distribution within a polycrystalline grain structure is modeled through a user material (UMAT) interface. Parametric studies on the effect of trench width and the height of the overburden were carried out. The results show that the grain structure and texture evolution are significantly altered by the presence of elastic strain energy.
AB - The paper addresses grain growth in copper interconnects in the presence of thermal expansion mismatch stresses. The evolution of grain structure and texture in copper in the simultaneous presence of two driving forces, curvature and elastic stored energy difference, is modeled by using a hybrid Potts model simulation approach. The elastic stored energy is calculated by using the commercial finite element code ABAQUS, where the effect of elastic anisotropy on the thermal mismatch stress and strain distribution within a polycrystalline grain structure is modeled through a user material (UMAT) interface. Parametric studies on the effect of trench width and the height of the overburden were carried out. The results show that the grain structure and texture evolution are significantly altered by the presence of elastic strain energy.
UR - http://www.scopus.com/inward/record.url?scp=77649174038&partnerID=8YFLogxK
U2 - 10.1557/proc-1156-d04-04
DO - 10.1557/proc-1156-d04-04
M3 - Conference contribution
AN - SCOPUS:77649174038
SN - 9781605111292
SN - 9781605111643
T3 - Materials Research Society Symposium Proceedings
SP - 79
EP - 84
BT - Materials, Processes, and Reliability for Advanced Interconnects for Micro- and Nanoelectronics - 2009
PB - Materials Research Society
T2 - 2009 MRS Spring Meeting
Y2 - 13 April 2009 through 17 April 2009
ER -