Corrigendum to "The effect of hydrogen in the mechanism of aluminium-induced crystallization of sputtered amorphous silicon using scanning auger microanalysis" [Thin Solid Films 510 (2006) 184-190] (DOI:10.1016/j.tsf.2006.01.003)

Maruf Hossain; Harry M. Meyer; Husam H. Abu-Safe; Hameed A. Naseem; William D. Brown

doi:10.1016/j.tsf.2007.06.002

Corrigendum to "The effect of hydrogen in the mechanism of aluminium-induced crystallization of sputtered amorphous silicon using scanning auger microanalysis" [Thin Solid Films 510 (2006) 184-190] (DOI:10.1016/j.tsf.2006.01.003)

Maruf Hossain
, Harry M. Meyer
, Husam H. Abu-Safe
, Hameed A. Naseem
, William D. Brown

Surface Chemistry & Catalysis Group

Research output: Contribution to journal › Comment/debate

Original language	English
Pages (from-to)	106
Number of pages	1
Journal	Thin Solid Films
Volume	516
Issue number	1
DOIs	https://doi.org/10.1016/j.tsf.2007.06.002
State	Published - Nov 1 2007

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10.1016/j.tsf.2007.06.002

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Hossain, M., Meyer, H. M., Abu-Safe, H. H., Naseem, H. A., & Brown, W. D. (2007). Corrigendum to "The effect of hydrogen in the mechanism of aluminium-induced crystallization of sputtered amorphous silicon using scanning auger microanalysis" [Thin Solid Films 510 (2006) 184-190] (DOI:10.1016/j.tsf.2006.01.003). Thin Solid Films, 516(1), 106. https://doi.org/10.1016/j.tsf.2007.06.002

@article{6c767728f01343959fcef54e418068d4,

title = "Corrigendum to {"}The effect of hydrogen in the mechanism of aluminium-induced crystallization of sputtered amorphous silicon using scanning auger microanalysis{"} [Thin Solid Films 510 (2006) 184-190] (DOI:10.1016/j.tsf.2006.01.003)",

author = "Maruf Hossain and Meyer, \{Harry M.\} and Abu-Safe, \{Husam H.\} and Naseem, \{Hameed A.\} and Brown, \{William D.\}",

year = "2007",

month = nov,

day = "1",

doi = "10.1016/j.tsf.2007.06.002",

language = "English",

volume = "516",

pages = "106",

journal = "Thin Solid Films",

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}

Hossain, M, Meyer, HM, Abu-Safe, HH, Naseem, HA & Brown, WD 2007, 'Corrigendum to "The effect of hydrogen in the mechanism of aluminium-induced crystallization of sputtered amorphous silicon using scanning auger microanalysis" [Thin Solid Films 510 (2006) 184-190] (DOI:10.1016/j.tsf.2006.01.003)', Thin Solid Films, vol. 516, no. 1, pp. 106. https://doi.org/10.1016/j.tsf.2007.06.002

Corrigendum to "The effect of hydrogen in the mechanism of aluminium-induced crystallization of sputtered amorphous silicon using scanning auger microanalysis" [Thin Solid Films 510 (2006) 184-190] (DOI:10.1016/j.tsf.2006.01.003). / Hossain, Maruf; Meyer, Harry M.; Abu-Safe, Husam H. et al.
In: Thin Solid Films, Vol. 516, No. 1, 01.11.2007, p. 106.

Research output: Contribution to journal › Comment/debate

TY - JOUR

T1 - Corrigendum to "The effect of hydrogen in the mechanism of aluminium-induced crystallization of sputtered amorphous silicon using scanning auger microanalysis" [Thin Solid Films 510 (2006) 184-190] (DOI:10.1016/j.tsf.2006.01.003)

AU - Hossain, Maruf

AU - Meyer, Harry M.

AU - Abu-Safe, Husam H.

AU - Naseem, Hameed A.

AU - Brown, William D.

PY - 2007/11/1

Y1 - 2007/11/1

UR - https://www.scopus.com/pages/publications/34848815021

U2 - 10.1016/j.tsf.2007.06.002

DO - 10.1016/j.tsf.2007.06.002

M3 - Comment/debate

AN - SCOPUS:34848815021

SN - 0040-6090

VL - 516

SP - 106

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1

ER -

Corrigendum to "The effect of hydrogen in the mechanism of aluminium-induced crystallization of sputtered amorphous silicon using scanning auger microanalysis" [Thin Solid Films 510 (2006) 184-190] (DOI:10.1016/j.tsf.2006.01.003)

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