Correlations of secondary phases (SPs) with mobility lifetime (μτe) of the electrons in CZT crystals using IR microscopy

Sachin Bhaladhare, W. Gitau Munge, Santosh Swain, Amlan Datta, Cody James Havrilak, Raji Soundararajan, Kelly Jones, Martine C. Duff, K. G. Lynn

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

Cadmium Zinc Telluride (CdZnTe/CZT) crystals were grown using a modified vertical Bridgman growth technique with 10 % Zn concentration at Washington State University (WSU). Analyses of the effects of volume (vol.) %, number density (cm-3), mean diameter (μm) of secondary phases (SPs) and thickness (mm) of the CZT crystals on single crystal properties such as carrier mobility lifetime (μτe) and resistivity (ρ) were performed. Some correlations were observed between μτe values of different CZT crystals and vol. %, number density, mean diameter of SPs and thickness of the crystals. High μτe and lower SP vol. % values were obtained for the ingots grown with rapid cool down times and with no intentional amounts of excess Te/Cd. For the selected samples, the effects of the SPs on the μτe values were established for the SPs whose mean diameters were ≤4 μm and >4 μm. These studies indicate vol. % and mean diameter of SPs are the important parameters for CZT crystal performance as a radiation detector.

Original languageEnglish
Title of host publicationHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII
DOIs
StatePublished - 2011
Externally publishedYes
EventHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII - San Diego, CA, United States
Duration: Aug 22 2011Aug 24 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8142
ISSN (Print)0277-786X

Conference

ConferenceHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII
Country/TerritoryUnited States
CitySan Diego, CA
Period08/22/1108/24/11

Keywords

  • CZT
  • IR microscope
  • Secondary phase
  • μτ

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