Correlation of Raman spectra with optical and electronic properties of a - Si:H

V. Kh Kudoyarova; O. I. Konkov; E. I. Terukov; A. P. Sokolov; A. P. Shebanin

doi:10.1016/0022-3093(89)90114-2

Correlation of Raman spectra with optical and electronic properties of a - Si:H

V. Kh Kudoyarova, O. I. Konkov, E. I. Terukov, A. P. Sokolov, A. P. Shebanin

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Raman scattering spectra, optical and electronic properties of a-Si:H films, prepared by HF decomposition of silane-argon mixture at various substrate temperatures T_s (160<T_s<430°C) have been measured. It was shown, that variation of T_s has a stronger effect on the medium or intermediate range than on the short range order (dispersion of the angle between the bonds). An analysis of the medium range order (the intensity of the low frequency TA mode) proves to be very important for understanding the electronic properties of a-Si:H films.

Original language	English
Pages (from-to)	205-207
Number of pages	3
Journal	Journal of Non-Crystalline Solids
Volume	114
Issue number	PART 1
DOIs	https://doi.org/10.1016/0022-3093(89)90114-2
State	Published - Dec 1 1989
Externally published	Yes

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title = "Correlation of Raman spectra with optical and electronic properties of a - Si:H",

abstract = "Raman scattering spectra, optical and electronic properties of a-Si:H films, prepared by HF decomposition of silane-argon mixture at various substrate temperatures Ts (160s<430°C) have been measured. It was shown, that variation of Ts has a stronger effect on the medium or intermediate range than on the short range order (dispersion of the angle between the bonds). An analysis of the medium range order (the intensity of the low frequency TA mode) proves to be very important for understanding the electronic properties of a-Si:H films.",

author = "Kudoyarova, \{V. Kh\} and Konkov, \{O. I.\} and Terukov, \{E. I.\} and Sokolov, \{A. P.\} and Shebanin, \{A. P.\}",

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T1 - Correlation of Raman spectra with optical and electronic properties of a - Si:H

AU - Kudoyarova, V. Kh

AU - Konkov, O. I.

AU - Terukov, E. I.

AU - Sokolov, A. P.

AU - Shebanin, A. P.

PY - 1989/12/1

Y1 - 1989/12/1

N2 - Raman scattering spectra, optical and electronic properties of a-Si:H films, prepared by HF decomposition of silane-argon mixture at various substrate temperatures Ts (160s<430°C) have been measured. It was shown, that variation of Ts has a stronger effect on the medium or intermediate range than on the short range order (dispersion of the angle between the bonds). An analysis of the medium range order (the intensity of the low frequency TA mode) proves to be very important for understanding the electronic properties of a-Si:H films.

AB - Raman scattering spectra, optical and electronic properties of a-Si:H films, prepared by HF decomposition of silane-argon mixture at various substrate temperatures Ts (160s<430°C) have been measured. It was shown, that variation of Ts has a stronger effect on the medium or intermediate range than on the short range order (dispersion of the angle between the bonds). An analysis of the medium range order (the intensity of the low frequency TA mode) proves to be very important for understanding the electronic properties of a-Si:H films.

UR - https://www.scopus.com/pages/publications/0024790672

U2 - 10.1016/0022-3093(89)90114-2

DO - 10.1016/0022-3093(89)90114-2

M3 - Article

AN - SCOPUS:0024790672

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VL - 114

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EP - 207

JO - Journal of Non-Crystalline Solids

JF - Journal of Non-Crystalline Solids

IS - PART 1

ER -

Correlation of Raman spectra with optical and electronic properties of a - Si:H

Abstract

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