Correlating small angle scattering spectra to electrical resistivity changes in a nickel-base superalloy

  • Ricky L. Whelchel
  • , V. S.K.G. Kelekanjeri
  • , Rosario A. Gerhardt
  • , Jan Ilavsky
  • , Ken C. Littrell

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations

    Abstract

    Waspaloy specimens aged at 800°C from 0.5h to 88.5h were evaluated via small angle neutron scattering (SANS), ultra small angle X-ray scattering (USAXS), electrical resistivity, and SEM. The average γ′ precipitate size and volume fraction, obtained from modeling the small angle scattering data, was used to calculate a figure of merit of electron scattering. This figure of merit is designed to correlate the electron scattering ability of the material to the precipitate microstructure. The USAXS data shows a secondary precipitate population at smaller diameters that is absent from the SANS data, since the SANS measurements were not obtained at high enough values of Q. It is believed that this secondary population makes the USAXS-derived figure of merit more sensitive to the actual measured resistivity response than the SANS-derived values; however, the SANS derived primary precipitate sizes are believed to more accurate due to a larger sample volume.

    Original languageEnglish
    Title of host publicationIn-Situ and Operando Probing of Energy Materials at Multiscale Down to Single Atomic Column - The Power of X-Rays, Neutrons and Electron Microscopy
    PublisherMaterials Research Society
    Pages145-150
    Number of pages6
    ISBN (Print)9781605112398
    DOIs
    StatePublished - 2010

    Publication series

    NameMaterials Research Society Symposium Proceedings
    Volume1262
    ISSN (Print)0272-9172

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