Correlating AFM probe morphology to image resolution for single-wall carbon nanotube tips

Scanning and transmission electron microscopy were used to image hundreds of single-wall carbon nanotube probes and to correlate probe morphology with AFM image resolution. Several methods for fabricating such probes were evaluated, resulting in a procedure that produces image-quality single-wall nanotube probes at a rate compatible with their routine use. Surprisingly, about one-third of the tips image with resolution better than the nanotube probe diameter and, in exceptional cases, with resolution better than 1 nm. This represents the highest lateral resolution reported to date for a SWNT probe.