Correlated formation and stability of SIA loops and stacking fault tetrahedra in high energy displacement cascades in copper

Roman E. Voskoboinikov, Yuri N. Osetsky, David J. Bacon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Atomistic modeling was conducted for an investigation of primary damage creation, self-interstitial and vacancy clusters formation, and their stability in high energy displacement cascades in copper The simulations were carried out for a wide range of temperatures (100 K ≤ T ≤ 900 K) and primary knock-on atom (PKA) energies 5 keV ≤ Epha ≤ 2.5 keV. This study of over 400 cascades is the largest yet reported for this metal. At least 20 cascades for each (Epka, T) pair were simulated in order to ensure statistical reliability of the results. The number of surviving point defects for each cascade and the mean value for cascades at the same temperature and PKA energy were found. The corresponding fraction of self-interstitial atoms (SIA) in dislocation loops and vacancies in stacking fault tetrahedron (SFT)-like clusters was calculated. Strong spatial and size correlation of SFTs and SIA clusters at low temperatures were established. In the context of high dose irradiation and the spatial overlap of displacement cascades, the stability of SFTs and dislocation loops inside an overlapping cascade region was investigated. It was observed that an SFT destroyed in the collision phase by a cascade is always recreated. On being completely enveloped by the region of displaced atoms, both SFT and SIA dislocation loops are destroyed with corresponding decrease of the number of residual point defects, whereas partial overlapping leads to increase in size of both types of cluster.

Original languageEnglish
Title of host publicationEffects of Radiation on Materials
Subtitle of host publication22nd Symposium
PublisherAmerican Society for Testing and Materials
Pages285-298
Number of pages14
ISBN (Print)0803134010, 9780803134010
StatePublished - 2006
Event22nd Symposium on Effects of Radiation on Materials - Boston, MA, United States
Duration: Jun 8 2004Jun 10 2004

Publication series

NameASTM Special Technical Publication
Volume1475 STP
ISSN (Print)0066-0558

Conference

Conference22nd Symposium on Effects of Radiation on Materials
Country/TerritoryUnited States
CityBoston, MA
Period06/8/0406/10/04

Keywords

  • Computer simulation
  • Dislocation loop
  • Displacement cascade
  • High dose irradiation
  • Radiation damage
  • Stacking fault tetrahedron

Fingerprint

Dive into the research topics of 'Correlated formation and stability of SIA loops and stacking fault tetrahedra in high energy displacement cascades in copper'. Together they form a unique fingerprint.

Cite this