CORRECTIONS FOR SYSTEMATIC ERRORS IN TRANSVERSE PHASE SPACE MEASUREMENTS AT PITZ

C. Richard; Z. Aboulbanine; G. Adhikari; N. Aftab; P. Boonpornprasert; G. Georgiev; M. Gross; A. Hoffmann; M. Krasilnikov; X. K. Li; A. Lueangaramwong; R. Niemczyk; H. Qian; F. Stephan; G. Vashchenko; T. Weilbach

doi:10.18429/JACoW-IBIC2022-TUP20

CORRECTIONS FOR SYSTEMATIC ERRORS IN TRANSVERSE PHASE SPACE MEASUREMENTS AT PITZ

C. Richard, Z. Aboulbanine, G. Adhikari, N. Aftab, P. Boonpornprasert, G. Georgiev, M. Gross, A. Hoffmann, M. Krasilnikov, X. K. Li, A. Lueangaramwong, R. Niemczyk, H. Qian, F. Stephan, G. Vashchenko, T. Weilbach

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The Photo Injector Test Facility at DESY in Zeuthen (PITZ) characterizes and optimizes electron sources for use at FLASH and European XFEL. At PITZ, the transverse phase space is measured using a single slit scan and scintillator screen method. With the trend in photoinjectors towards lower current and emittance, these measurements become increasingly influenced by systematic errors including camera resolution and scintillator response due to smaller spot sizes. This study investigates the effects and corrections of the systematic errors for phase space measurements at PITZ.

Original language	English
Title of host publication	2022 International Beam Instrumentation Conference, IBIC 2022 - Proceedings
Publisher	JACoW Publishing
Pages	273-276
Number of pages	4
ISBN (Electronic)	9783954502417
DOIs	https://doi.org/10.18429/JACoW-IBIC2022-TUP20
State	Published - 2022
Externally published	Yes
Event	11th International Beam Instrumentation Conference, IBIC 2022 - Krakow, Poland Duration: Sep 11 2022 → Sep 15 2022

Publication series

Name	Proceedings of the International Beam Instrumentation Conference, IBIC
ISSN (Electronic)	2673-5350

Conference

Conference	11th International Beam Instrumentation Conference, IBIC 2022
Country/Territory	Poland
City	Krakow
Period	09/11/22 → 09/15/22

Access to Document

10.18429/JACoW-IBIC2022-TUP20

Cite this

Richard, C., Aboulbanine, Z., Adhikari, G., Aftab, N., Boonpornprasert, P., Georgiev, G., Gross, M., Hoffmann, A., Krasilnikov, M., Li, X. K., Lueangaramwong, A., Niemczyk, R., Qian, H., Stephan, F., Vashchenko, G., & Weilbach, T. (2022). CORRECTIONS FOR SYSTEMATIC ERRORS IN TRANSVERSE PHASE SPACE MEASUREMENTS AT PITZ. In 2022 International Beam Instrumentation Conference, IBIC 2022 - Proceedings (pp. 273-276). (Proceedings of the International Beam Instrumentation Conference, IBIC). JACoW Publishing. https://doi.org/10.18429/JACoW-IBIC2022-TUP20

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title = "CORRECTIONS FOR SYSTEMATIC ERRORS IN TRANSVERSE PHASE SPACE MEASUREMENTS AT PITZ",

abstract = "The Photo Injector Test Facility at DESY in Zeuthen (PITZ) characterizes and optimizes electron sources for use at FLASH and European XFEL. At PITZ, the transverse phase space is measured using a single slit scan and scintillator screen method. With the trend in photoinjectors towards lower current and emittance, these measurements become increasingly influenced by systematic errors including camera resolution and scintillator response due to smaller spot sizes. This study investigates the effects and corrections of the systematic errors for phase space measurements at PITZ.",

author = "C. Richard and Z. Aboulbanine and G. Adhikari and N. Aftab and P. Boonpornprasert and G. Georgiev and M. Gross and A. Hoffmann and M. Krasilnikov and Li, {X. K.} and A. Lueangaramwong and R. Niemczyk and H. Qian and F. Stephan and G. Vashchenko and T. Weilbach",

note = "Publisher Copyright: {\textcopyright} 2022 Proceedings of the International Beam Instrumentation Conference, IBIC. All rights reserved.; 11th International Beam Instrumentation Conference, IBIC 2022 ; Conference date: 11-09-2022 Through 15-09-2022",

year = "2022",

doi = "10.18429/JACoW-IBIC2022-TUP20",

language = "English",

series = "Proceedings of the International Beam Instrumentation Conference, IBIC",

publisher = "JACoW Publishing",

pages = "273--276",

booktitle = "2022 International Beam Instrumentation Conference, IBIC 2022 - Proceedings",

}

Richard, C, Aboulbanine, Z, Adhikari, G, Aftab, N, Boonpornprasert, P, Georgiev, G, Gross, M, Hoffmann, A, Krasilnikov, M, Li, XK, Lueangaramwong, A, Niemczyk, R, Qian, H, Stephan, F, Vashchenko, G & Weilbach, T 2022, CORRECTIONS FOR SYSTEMATIC ERRORS IN TRANSVERSE PHASE SPACE MEASUREMENTS AT PITZ. in 2022 International Beam Instrumentation Conference, IBIC 2022 - Proceedings. Proceedings of the International Beam Instrumentation Conference, IBIC, JACoW Publishing, pp. 273-276, 11th International Beam Instrumentation Conference, IBIC 2022, Krakow, Poland, 09/11/22. https://doi.org/10.18429/JACoW-IBIC2022-TUP20

CORRECTIONS FOR SYSTEMATIC ERRORS IN TRANSVERSE PHASE SPACE MEASUREMENTS AT PITZ. / Richard, C.; Aboulbanine, Z.; Adhikari, G. et al.
2022 International Beam Instrumentation Conference, IBIC 2022 - Proceedings. JACoW Publishing, 2022. p. 273-276 (Proceedings of the International Beam Instrumentation Conference, IBIC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - CORRECTIONS FOR SYSTEMATIC ERRORS IN TRANSVERSE PHASE SPACE MEASUREMENTS AT PITZ

AU - Richard, C.

AU - Aboulbanine, Z.

AU - Adhikari, G.

AU - Aftab, N.

AU - Boonpornprasert, P.

AU - Georgiev, G.

AU - Gross, M.

AU - Hoffmann, A.

AU - Krasilnikov, M.

AU - Li, X. K.

AU - Lueangaramwong, A.

AU - Niemczyk, R.

AU - Qian, H.

AU - Stephan, F.

AU - Vashchenko, G.

AU - Weilbach, T.

PY - 2022

Y1 - 2022

N2 - The Photo Injector Test Facility at DESY in Zeuthen (PITZ) characterizes and optimizes electron sources for use at FLASH and European XFEL. At PITZ, the transverse phase space is measured using a single slit scan and scintillator screen method. With the trend in photoinjectors towards lower current and emittance, these measurements become increasingly influenced by systematic errors including camera resolution and scintillator response due to smaller spot sizes. This study investigates the effects and corrections of the systematic errors for phase space measurements at PITZ.

AB - The Photo Injector Test Facility at DESY in Zeuthen (PITZ) characterizes and optimizes electron sources for use at FLASH and European XFEL. At PITZ, the transverse phase space is measured using a single slit scan and scintillator screen method. With the trend in photoinjectors towards lower current and emittance, these measurements become increasingly influenced by systematic errors including camera resolution and scintillator response due to smaller spot sizes. This study investigates the effects and corrections of the systematic errors for phase space measurements at PITZ.

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U2 - 10.18429/JACoW-IBIC2022-TUP20

DO - 10.18429/JACoW-IBIC2022-TUP20

M3 - Conference contribution

AN - SCOPUS:85185833499

T3 - Proceedings of the International Beam Instrumentation Conference, IBIC

SP - 273

EP - 276

BT - 2022 International Beam Instrumentation Conference, IBIC 2022 - Proceedings

PB - JACoW Publishing

T2 - 11th International Beam Instrumentation Conference, IBIC 2022

Y2 - 11 September 2022 through 15 September 2022

ER -

Richard C, Aboulbanine Z, Adhikari G, Aftab N, Boonpornprasert P, Georgiev G et al. CORRECTIONS FOR SYSTEMATIC ERRORS IN TRANSVERSE PHASE SPACE MEASUREMENTS AT PITZ. In 2022 International Beam Instrumentation Conference, IBIC 2022 - Proceedings. JACoW Publishing. 2022. p. 273-276. (Proceedings of the International Beam Instrumentation Conference, IBIC). doi: 10.18429/JACoW-IBIC2022-TUP20

CORRECTIONS FOR SYSTEMATIC ERRORS IN TRANSVERSE PHASE SPACE MEASUREMENTS AT PITZ

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