Abstract
The Supporting Information is available free of charge on the ACS Publications website at DOI: 10.1021/acs.jpcc.8b06859. Picture of Hegman gauge measurement; deconvolution of Si 2p orbitals; XRD of NA 70-130 Si; table of changes in Si crystallite size based of Scherrer analysis; XRD of AA 325 Si; XPS of 2p orbitals form AA 325 Si; deconvolution of 29Si MAS NMR; SEM of NA 30-170 Si before and after milling; XPS of C45 CB (PDF).
Original language | English |
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Pages (from-to) | 18194 |
Number of pages | 1 |
Journal | Journal of Physical Chemistry C |
Volume | 122 |
Issue number | 31 |
DOIs |
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State | Published - Aug 9 2018 |