TY - JOUR
T1 - Correction to
T2 - Building Structures Atom by Atom via Electron Beam Manipulation (Small, (2018), 14, 38, (1801771), 10.1002/smll.201801771)
AU - Dyck, Ondrej
AU - Kim, Songkil
AU - Jimenez-Izal, Elisa
AU - Alexandrova, Anastassia N.
AU - Kalinin, Sergei V.
AU - Jesse, Stephen
N1 - Publisher Copyright:
© 2019 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
PY - 2019/2/22
Y1 - 2019/2/22
N2 - Small 2018, 14, 1801771 In the original article, there was an unfortunate oversight stating that scanning tunneling microscopy is the only platform that offers single atom manipulation. Below, the article has been updated to include atomic force microscopy as an additional method, with supporting references. The authors apologize for any inconvenience this may have caused. The second sentence in the Abstract is updated as follows: “Until recently the only platform that offers single atom manipulation is scanning probe microscopy.” The first sentence of the second paragraph in the Introduction is updated as follows: “Despite the remarkable progress in STM and atomic force microscopy (AFM)-based atomic fabrication,[66-68] the fabrication process remains slow and requires complex surface science approaches to establish and maintain atomically clean surfaces.” [66] N. Oyabu, Ó. Custance, I. Yi, Y. Sugawara, S. Morita, Phys. Rev. Lett. 2003, 90, 176102, https://doi.org/10.1103/PhysRevLett.90.176102. [67] Y. Sugimoto, M. Abe, S. Hirayama, N. Oyabu, Ó. Custance, S. Morita, Nat. Mater. 2005, 4, 156, https://doi.org/10.1038/nmat1297. [68] Y. Sugimoto, P. Pou, O. Custance, P. Jelinek, M. Abe, R. Perez, S. Morita, Science 2008, 322, 413, https://doi.org/10.1126/science.1160601.
AB - Small 2018, 14, 1801771 In the original article, there was an unfortunate oversight stating that scanning tunneling microscopy is the only platform that offers single atom manipulation. Below, the article has been updated to include atomic force microscopy as an additional method, with supporting references. The authors apologize for any inconvenience this may have caused. The second sentence in the Abstract is updated as follows: “Until recently the only platform that offers single atom manipulation is scanning probe microscopy.” The first sentence of the second paragraph in the Introduction is updated as follows: “Despite the remarkable progress in STM and atomic force microscopy (AFM)-based atomic fabrication,[66-68] the fabrication process remains slow and requires complex surface science approaches to establish and maintain atomically clean surfaces.” [66] N. Oyabu, Ó. Custance, I. Yi, Y. Sugawara, S. Morita, Phys. Rev. Lett. 2003, 90, 176102, https://doi.org/10.1103/PhysRevLett.90.176102. [67] Y. Sugimoto, M. Abe, S. Hirayama, N. Oyabu, Ó. Custance, S. Morita, Nat. Mater. 2005, 4, 156, https://doi.org/10.1038/nmat1297. [68] Y. Sugimoto, P. Pou, O. Custance, P. Jelinek, M. Abe, R. Perez, S. Morita, Science 2008, 322, 413, https://doi.org/10.1126/science.1160601.
UR - http://www.scopus.com/inward/record.url?scp=85061932684&partnerID=8YFLogxK
U2 - 10.1002/smll.201805310
DO - 10.1002/smll.201805310
M3 - Comment/debate
C2 - 30794346
AN - SCOPUS:85061932684
SN - 1613-6810
VL - 15
JO - Small
JF - Small
IS - 8
M1 - 1805310
ER -