Correction to: Building Structures Atom by Atom via Electron Beam Manipulation (Small, (2018), 14, 38, (1801771), 10.1002/smll.201801771)

Ondrej Dyck, Songkil Kim, Elisa Jimenez-Izal, Anastassia N. Alexandrova, Sergei V. Kalinin, Stephen Jesse

Research output: Contribution to journalComment/debate

2 Scopus citations

Abstract

Small 2018, 14, 1801771 In the original article, there was an unfortunate oversight stating that scanning tunneling microscopy is the only platform that offers single atom manipulation. Below, the article has been updated to include atomic force microscopy as an additional method, with supporting references. The authors apologize for any inconvenience this may have caused. The second sentence in the Abstract is updated as follows: “Until recently the only platform that offers single atom manipulation is scanning probe microscopy.” The first sentence of the second paragraph in the Introduction is updated as follows: “Despite the remarkable progress in STM and atomic force microscopy (AFM)-based atomic fabrication,[66-68] the fabrication process remains slow and requires complex surface science approaches to establish and maintain atomically clean surfaces.” [66] N. Oyabu, Ó. Custance, I. Yi, Y. Sugawara, S. Morita, Phys. Rev. Lett. 2003, 90, 176102, https://doi.org/10.1103/PhysRevLett.90.176102. [67] Y. Sugimoto, M. Abe, S. Hirayama, N. Oyabu, Ó. Custance, S. Morita, Nat. Mater. 2005, 4, 156, https://doi.org/10.1038/nmat1297. [68] Y. Sugimoto, P. Pou, O. Custance, P. Jelinek, M. Abe, R. Perez, S. Morita, Science 2008, 322, 413, https://doi.org/10.1126/science.1160601.

Original languageEnglish
Article number1805310
JournalSmall
Volume15
Issue number8
DOIs
StatePublished - Feb 22 2019

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