TY - GEN
T1 - Core Losses of Nanocrystalline Materials under DC Bias Conditions
AU - Mauger, Mickael J.
AU - Zheng, Xiwei
AU - Kandula, Prasad
AU - Divan, Deepak
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/3
Y1 - 2020/3
N2 - Numerous power electronics topologies rely on magnetic components operating with a DC bias flux, resulting in higher core losses. The losses of nanocrystalline gapped cores as a function of the DC flux density, up to 0.95 T, are reported in this paper for various AC flux density ripple, up to 300 mT peak-to- peak. An unprecedented relative loss level increase has been measured under large DC bias, and the phenomenon has been observed to be more pronounced at lower AC flux density ripple.
AB - Numerous power electronics topologies rely on magnetic components operating with a DC bias flux, resulting in higher core losses. The losses of nanocrystalline gapped cores as a function of the DC flux density, up to 0.95 T, are reported in this paper for various AC flux density ripple, up to 300 mT peak-to- peak. An unprecedented relative loss level increase has been measured under large DC bias, and the phenomenon has been observed to be more pronounced at lower AC flux density ripple.
KW - Core losses
KW - DC bias
KW - DPF
KW - displacement factor
KW - nanocrystalline material
KW - soft magnetic material.
UR - http://www.scopus.com/inward/record.url?scp=85087768263&partnerID=8YFLogxK
U2 - 10.1109/APEC39645.2020.9124079
DO - 10.1109/APEC39645.2020.9124079
M3 - Conference contribution
AN - SCOPUS:85087768263
T3 - Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
SP - 1
EP - 5
BT - APEC 2020 - 35th Annual IEEE Applied Power Electronics Conference and Exposition
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 35th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2020
Y2 - 15 March 2020 through 19 March 2020
ER -