Controlled nanopatterning of a polymerized ionic liquid in a strong electric field

Vera Bocharova, Alexander L. Agapov, Alexander Tselev, Liam Collins, Rajeev Kumar, Stefan Berdzinski, Veronika Strehmel, Alexander Kisliuk, Ivan I. Kravchenko, Bobby G. Sumpter, Alexei P. Sokolov, Sergei V. Kalinin, Evgheni Strelcov

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

Nanolithography has become a driving force in advancements of the modern day's electronics, allowing for miniaturization of devices and a steady increase of the calculation, power, and storage densities. Among various nanofabrication approaches, scanning probe techniques, including atomic force microscopy (AFM), are versatile tools for creating nanoscale patterns utilizing a range of physical stimuli such as force, heat, or electric fi eld confi ned to the nanoscale. In this study, the potential of using the electric fi eld localized at the apex of an AFM tip to induce and control changes in the mechanical properties of an ion containing polymer-a polymerized ionic liquid (PolyIL)-on a very localized scale is explored. In particular, it is demonstrated that by means of AFM, one can form topographical features on the surface of PolyIL-based thin fi lms with a signifi cantly lower electric potential and power consumption as compared to nonconductive polymer materials. Furthermore, by tuning the applied voltage and ambient air humidity, control over dimensions of the formed structures is reproducibly achieved.

Original languageEnglish
Pages (from-to)805-811
Number of pages7
JournalAdvanced Functional Materials
Volume25
Issue number5
DOIs
StatePublished - Feb 4 2015

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