Abstract
A two-step solution processing approach has been established to grow void-free perovskite films for low-cost high-performance planar heterojunction photovoltaic devices. A high-temperature thermal annealing treatment was applied to drive the diffusion of CH3NH3I precursor molecules into a compact PbI2 layer to form perovskite films. However, thermal annealing for extended periods led to degraded device performance owing to the defects generated by decomposition of perovskite into PbI2. A controllable layer-by-layer spin-coating method was used to grow "bilayer" CH3NH3I/PbI2 films, and then drive the interdiffusion between PbI2 and CH3NH3I layers by a simple air exposure at room temperature for making well-oriented, highly crystalline perovskite films without thermal annealing. This high degree of crystallinity resulted in a carrier diffusion length of ca. 800 nm and a high device efficiency of 15.6 %, which is comparable to values reported for thermally annealed perovskite films. A breath of fresh air: Simple room-temperature air exposure can drive the interdiffusion between perovskite precursor layers and crystallize the perovskite thin films. The obtained perovskite films show high crystallinity and well-aligned orientation. The devices with and without a TiO2 electron transporting layer yielded high efficiencies of 15.6 % and 13.8 %, respectively.
Original language | English |
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Pages (from-to) | 14862-14865 |
Number of pages | 4 |
Journal | Angewandte Chemie - International Edition |
Volume | 54 |
Issue number | 49 |
DOIs | |
State | Published - Dec 1 2015 |
Funding
This research was conducted at the Center for Nanophase Materials Sciences (CNMS), which is a DOE Office of Science User Facility.
Funders | Funder number |
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Office of Science |
Keywords
- air exposure
- in situ X-ray diffraction
- perovskites
- photovoltaic devices
- thin films