Considerations for a soft x-ray spectromicroscopy beamline

B. Winn, X. Hao, C. Jacobsen, J. Kirz, J. Miao, S. Wirick, H. Ade, C. Buckley, M. Howells, S. Hulbert, I. McNulty, T. Oversluizen

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

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Physics