Abstract
A CMOS voltage DAC has been developed for integration into multiple front-end electronics ASICs associated with the PHENIX detector located at the RHIC accelerator of Brookhaven National Laboratory. The topology allows wide-range output programmability by selection of an offset voltage and on-chip resistor and transistor sizing. The DAC is trimless and requires no external components, making it ideal for highly integrated collider detector systems. Errors associated with on-chip bias are minimized using a topology that implements a ratiometric relationship which compensates for absolute resistance value changes and is limited only by errors in the on-chip matching of MOSFETs and resistive devices. Temperature-induced errors associated with the integrated resistors are also minimized by the circuit topology and monolithic construction. All reference voltages and currents are derived using a single regulated voltage supply. This paper presents the general DAC architecture and design method, discusses on-chip matching issues and tradeoffs associated with device sizing and monolithic layout, and presents measured performance of various gate length DACs fabricated in a 1.2 μm CMOS process including integral nonlinearity, differential nonlinearity, and slope and offset errors.
Original language | English |
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Pages | 671-674 |
Number of pages | 4 |
State | Published - 1997 |
Event | Proceedings of the 1997 IEEE Nuclear Science Symposium - Albuquerque, NM, USA Duration: Nov 9 1997 → Nov 15 1997 |
Conference
Conference | Proceedings of the 1997 IEEE Nuclear Science Symposium |
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City | Albuquerque, NM, USA |
Period | 11/9/97 → 11/15/97 |