Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis

C. Zhang; S. Balachandran; P. Eisenlohr; M. A. Crimp; C. Boehlert; R. Xu; T. R. Bieler

doi:10.1016/j.scriptamat.2017.09.043

Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis

C. Zhang, S. Balachandran, P. Eisenlohr, M. A. Crimp, C. Boehlert, R. Xu, T. R. Bieler

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

The subsurface dislocation content in a Ti-5Al-2.5Sn (wt%) uniaxial tension sample deformed at ambient temperature was characterized by peak streak analysis of micro-Laue diffraction patterns collected non-destructively by differential aperture X-ray microscopy, and with focused ion beam transmission electron microscopy of material in the same volume. This comparison reveals that micro-Laue diffraction streak analysis based on an edge dislocation assumption can accurately identify the dominant dislocation slip system history (Burgers vector and plane observed by TEM), despite the fact that dislocations have predominantly screw character. Other dislocations identified by TEM were not convincingly discernible from the peak streak analysis.

Original language	English
Pages (from-to)	74-77
Number of pages	4
Journal	Scripta Materialia
Volume	144
DOIs	https://doi.org/10.1016/j.scriptamat.2017.09.043
State	Published - Feb 2018
Externally published	Yes

Keywords

Differential aperture X-ray microscopy (DAXM)
Geometrically necessary dislocations (GNDs)

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10.1016/j.scriptamat.2017.09.043

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title = "Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis",

abstract = "The subsurface dislocation content in a Ti-5Al-2.5Sn (wt%) uniaxial tension sample deformed at ambient temperature was characterized by peak streak analysis of micro-Laue diffraction patterns collected non-destructively by differential aperture X-ray microscopy, and with focused ion beam transmission electron microscopy of material in the same volume. This comparison reveals that micro-Laue diffraction streak analysis based on an edge dislocation assumption can accurately identify the dominant dislocation slip system history (Burgers vector and plane observed by TEM), despite the fact that dislocations have predominantly screw character. Other dislocations identified by TEM were not convincingly discernible from the peak streak analysis.",

keywords = "Differential aperture X-ray microscopy (DAXM), Geometrically necessary dislocations (GNDs)",

author = "C. Zhang and S. Balachandran and P. Eisenlohr and Crimp, {M. A.} and C. Boehlert and R. Xu and Bieler, {T. R.}",

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doi = "10.1016/j.scriptamat.2017.09.043",

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T1 - Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis

AU - Zhang, C.

AU - Balachandran, S.

AU - Eisenlohr, P.

AU - Crimp, M. A.

AU - Boehlert, C.

AU - Xu, R.

AU - Bieler, T. R.

PY - 2018/2

Y1 - 2018/2

N2 - The subsurface dislocation content in a Ti-5Al-2.5Sn (wt%) uniaxial tension sample deformed at ambient temperature was characterized by peak streak analysis of micro-Laue diffraction patterns collected non-destructively by differential aperture X-ray microscopy, and with focused ion beam transmission electron microscopy of material in the same volume. This comparison reveals that micro-Laue diffraction streak analysis based on an edge dislocation assumption can accurately identify the dominant dislocation slip system history (Burgers vector and plane observed by TEM), despite the fact that dislocations have predominantly screw character. Other dislocations identified by TEM were not convincingly discernible from the peak streak analysis.

AB - The subsurface dislocation content in a Ti-5Al-2.5Sn (wt%) uniaxial tension sample deformed at ambient temperature was characterized by peak streak analysis of micro-Laue diffraction patterns collected non-destructively by differential aperture X-ray microscopy, and with focused ion beam transmission electron microscopy of material in the same volume. This comparison reveals that micro-Laue diffraction streak analysis based on an edge dislocation assumption can accurately identify the dominant dislocation slip system history (Burgers vector and plane observed by TEM), despite the fact that dislocations have predominantly screw character. Other dislocations identified by TEM were not convincingly discernible from the peak streak analysis.

KW - Differential aperture X-ray microscopy (DAXM)

KW - Geometrically necessary dislocations (GNDs)

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U2 - 10.1016/j.scriptamat.2017.09.043

DO - 10.1016/j.scriptamat.2017.09.043

M3 - Article

AN - SCOPUS:85030485995

SN - 1359-6462

VL - 144

SP - 74

EP - 77

JO - Scripta Materialia

JF - Scripta Materialia

ER -

Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis

Abstract

Keywords

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