Comparison of critical adsorption scaling functions obtained from neutron reflectometry and ellipsometry

  • M. D. Brown
  • , B. M. Law
  • , S. Satija
  • , W. A. Hamilton
  • , E. Watkins
  • , J. H.J. Cho
  • , J. Majewski

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

Carpenter [Phys. Rev. E 59, 5655 (1999); 61, 532 (2000)] managed to explain ellipsometric critical adsorption data collected from the liquid-vapor interface of four different critical binary liquid mixtures near their demixing critical temperature using a single model. This was the first time a single universal function had been found which could quantitatively describe the surface critical behavior of many different mixtures. There have also been various attempts to investigate this surface critical behavior using neutron and x-ray reflectometries. Results have been mixed and have often been at variance with Carpenter In this paper, the authors show that neutron reflectometry data collected from a crystalline quartz-critical mixture interface, specifically deuterated water plus 3-methylpyridine, can be quantitatively explained using the model of Carpenter derived from ellipsometric data.

Original languageEnglish
Article number204704
JournalJournal of Chemical Physics
Volume126
Issue number20
DOIs
StatePublished - 2007
Externally publishedYes

Funding

One of the authors (B.M.L.) acknowledges support for this work from the U.S. Department of Energy through Grant No. DE-FG02-02ER46020 and partial support through the U.S. National Science Foundation through Grant No. DMR-0603144. Oak Ridge National Laboratory is managed for the U.S. Department of Energy under Contract No. DE-AC05-00OR22725 by UT-Battelle LLC. The authors acknowledge valuable discussions with Greg Smith on various neutron reflectometry related issues.

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