Comparative study of thickness dependence of critical current density of YBa2Cu3O7-δ on (100) SrTiO3 and on rolling-assisted biaxially textured substrates

B. W. Kang, A. Goyal, D. F. Lee, J. E. Mathis, E. D. Specht, P. M. Martin, D. M. Kroeger, M. Paranthaman, S. Sathyamurthy

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Abstract

We investigated the dependence of critical current density (Jc) on thickness of YBa2Cu3O7-δ (YBCO) films grown by pulsed laser deposition on (100) SrTiO3 (STO) and on rolling-assisted biaxially textured substrates (RABiTS). The thickness of YBCO films varied from 0.19 to 3 μm. The highest Jcs of 5.3 and 2.6 MA/cm2 at 77 K, self-field were obtained for 0.19-μm YBCO films on STO and RABiTS, respectively. Jc was found to decrease exponentially with YBCO thickness on both substrates. However, the results suggest different mechanisms are responsible for the Jc reduction in the two cases. On STO, growth of a-axis grains within c-axis films and broadening of the in-plane texture were observed in thick films. On RABiTS, degradation in cube texture as well as development of a porous surface morphology were found to correlate with film thickness.

Original languageEnglish
Pages (from-to)1750-1757
Number of pages8
JournalJournal of Materials Research
Volume17
Issue number7
DOIs
StatePublished - Jul 2002

Funding

B.W. Kang is grateful to S.W. Lu for his help on RBS measurement. Research was sponsored by the United States Department of Energy, Office of Energy Efficiency and Renewable Energy, and Office of Power Technologies—Superconductivity Program. This research was performed at the Oak Ridge National Laboratory, managed by UT-Battelle, LLC for the United States Department of Energy under Contract No. DE-AC05-00OR22725. The authors (B.W. Kang and S. Sathyamur-thy) are grateful to Oak Ridge Associated Universities for their support.

FundersFunder number
UT-Battelle
United States Department of Energy
Office of Energy Efficiency and Renewable Energy
Oak Ridge National Laboratory
Water Power Technologies Office

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