Comment on "high-resolution electron microscopy investigations on stacking faults in SrBi2Ta2O9 ferroelectric thin films" [Appl. Phys. Lett. 78, 973 (2001)]

M. A. Zurbuchen; D. G. Schlom; S. K. Streiffer

doi:10.1063/1.1390315

Comment on "high-resolution electron microscopy investigations on stacking faults in SrBi₂Ta₂O₉ ferroelectric thin films" [Appl. Phys. Lett. 78, 973 (2001)]

M. A. Zurbuchen
, D. G. Schlom
, S. K. Streiffer

Research output: Contribution to journal › Comment/debate

4 Scopus citations

Original language	English
Pages (from-to)	887
Number of pages	1
Journal	Applied Physics Letters
Volume	79
Issue number	6
DOIs	https://doi.org/10.1063/1.1390315
State	Published - Aug 6 2001
Externally published	Yes

Access to Document

10.1063/1.1390315

Cite this

@article{e52e0f82b0384545b7e2f47964b40a6e,

title = "Comment on {"}high-resolution electron microscopy investigations on stacking faults in SrBi2Ta2O9 ferroelectric thin films{"} [Appl. Phys. Lett. 78, 973 (2001)]",

author = "Zurbuchen, \{M. A.\} and Schlom, \{D. G.\} and Streiffer, \{S. K.\}",

year = "2001",

month = aug,

day = "6",

doi = "10.1063/1.1390315",

language = "English",

volume = "79",

pages = "887",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "6",

}

TY - JOUR

T1 - Comment on "high-resolution electron microscopy investigations on stacking faults in SrBi2Ta2O9 ferroelectric thin films" [Appl. Phys. Lett. 78, 973 (2001)]

AU - Zurbuchen, M. A.

AU - Schlom, D. G.

AU - Streiffer, S. K.

PY - 2001/8/6

Y1 - 2001/8/6

UR - https://www.scopus.com/pages/publications/17944369911

U2 - 10.1063/1.1390315

DO - 10.1063/1.1390315

M3 - Comment/debate

AN - SCOPUS:17944369911

SN - 0003-6951

VL - 79

SP - 887

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 6

ER -

Comment on "high-resolution electron microscopy investigations on stacking faults in SrBi2Ta2O9 ferroelectric thin films" [Appl. Phys. Lett. 78, 973 (2001)]

Access to Document

Other files and links

Cite this

Comment on "high-resolution electron microscopy investigations on stacking faults in SrBi₂Ta₂O₉ ferroelectric thin films" [Appl. Phys. Lett. 78, 973 (2001)]