Combined SEM electron-beam-induced current and cathodoluminescence imaging and STEM structural analysis of GaN light emitting diodes

C. M. Parish, C. L. Progl, M. E. Salmon, P. E. Russell

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	1514-1515
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606066578
State	Published - Aug 2006
Externally published	Yes

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title = "Combined SEM electron-beam-induced current and cathodoluminescence imaging and STEM structural analysis of GaN light emitting diodes",

author = "Parish, \{C. M.\} and Progl, \{C. L.\} and Salmon, \{M. E.\} and Russell, \{P. E.\}",

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language = "English",

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T1 - Combined SEM electron-beam-induced current and cathodoluminescence imaging and STEM structural analysis of GaN light emitting diodes

AU - Parish, C. M.

AU - Progl, C. L.

AU - Salmon, M. E.

AU - Russell, P. E.

PY - 2006/8

Y1 - 2006/8

UR - https://www.scopus.com/pages/publications/33750875470

U2 - 10.1017/S1431927606066578

DO - 10.1017/S1431927606066578

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SN - 1431-9276

VL - 12

SP - 1514

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

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