Abstract
We have used Cu Kα radiation to measure both specular reflectivity (000) and longitudinal Bragg diffraction (222) from a Co/Pt multilayer grown by molecular-beam epitaxy on a sapphire (0001) substrate. By refining both low- and high-angle profiles, we are able to separate the effects of surface morphology from microstructure. Our results indicate mixing at the interfaces consistent with the existence of alloy or compound formation.
| Original language | English |
|---|---|
| Pages (from-to) | 6427-6429 |
| Number of pages | 3 |
| Journal | Journal of Applied Physics |
| Volume | 73 |
| Issue number | 10 |
| DOIs | |
| State | Published - 1993 |
| Externally published | Yes |