Combined low- and high-angle x-ray structural refinement of a Co/Pt(111) multilayer exhibiting perpendicular magnetic anisotropy

J. F. Ankner; J. A. Borchers; R. F.C. Farrow; R. F. Marks

doi:10.1063/1.352621

Combined low- and high-angle x-ray structural refinement of a Co/Pt(111) multilayer exhibiting perpendicular magnetic anisotropy

J. F. Ankner, J. A. Borchers, R. F.C. Farrow, R. F. Marks

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3 Scopus citations

Abstract

We have used Cu Kα radiation to measure both specular reflectivity (000) and longitudinal Bragg diffraction (222) from a Co/Pt multilayer grown by molecular-beam epitaxy on a sapphire (0001) substrate. By refining both low- and high-angle profiles, we are able to separate the effects of surface morphology from microstructure. Our results indicate mixing at the interfaces consistent with the existence of alloy or compound formation.

Original language	English
Pages (from-to)	6427-6429
Number of pages	3
Journal	Journal of Applied Physics
Volume	73
Issue number	10
DOIs	https://doi.org/10.1063/1.352621
State	Published - 1993
Externally published	Yes

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10.1063/1.352621

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abstract = "We have used Cu Kα radiation to measure both specular reflectivity (000) and longitudinal Bragg diffraction (222) from a Co/Pt multilayer grown by molecular-beam epitaxy on a sapphire (0001) substrate. By refining both low- and high-angle profiles, we are able to separate the effects of surface morphology from microstructure. Our results indicate mixing at the interfaces consistent with the existence of alloy or compound formation.",

author = "Ankner, {J. F.} and Borchers, {J. A.} and Farrow, {R. F.C.} and Marks, {R. F.}",

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AU - Ankner, J. F.

AU - Borchers, J. A.

AU - Farrow, R. F.C.

AU - Marks, R. F.

PY - 1993

Y1 - 1993

N2 - We have used Cu Kα radiation to measure both specular reflectivity (000) and longitudinal Bragg diffraction (222) from a Co/Pt multilayer grown by molecular-beam epitaxy on a sapphire (0001) substrate. By refining both low- and high-angle profiles, we are able to separate the effects of surface morphology from microstructure. Our results indicate mixing at the interfaces consistent with the existence of alloy or compound formation.

AB - We have used Cu Kα radiation to measure both specular reflectivity (000) and longitudinal Bragg diffraction (222) from a Co/Pt multilayer grown by molecular-beam epitaxy on a sapphire (0001) substrate. By refining both low- and high-angle profiles, we are able to separate the effects of surface morphology from microstructure. Our results indicate mixing at the interfaces consistent with the existence of alloy or compound formation.

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Combined low- and high-angle x-ray structural refinement of a Co/Pt(111) multilayer exhibiting perpendicular magnetic anisotropy

Abstract

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