Column-by-column observation of dislocation motion in CdTe: Dynamic scanning transmission electron microscopy

Chen Li; Yu Yang Zhang; Timothy J. Pennycook; Yelong Wu; Andrew R. Lupini; Naba Paudel; Sokrates T. Pantelides; Yanfa Yan; Stephen J. Pennycook

doi:10.1063/1.4963765

Column-by-column observation of dislocation motion in CdTe: Dynamic scanning transmission electron microscopy

Chen Li, Yu Yang Zhang, Timothy J. Pennycook, Yelong Wu, Andrew R. Lupini, Naba Paudel, Sokrates T. Pantelides, Yanfa Yan, Stephen J. Pennycook

electron Microscopy and Microanalysis

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

The dynamics of partial dislocations in CdTe have been observed at the atomic scale using aberration-corrected scanning transmission electron microscopy (STEM), allowing the mobility of different dislocations to be directly compared: Cd-core Shockley partial dislocations are more mobile than Te-core partials, and dislocation cores with unpaired columns have higher mobility than those without unpaired columns. The dynamic imaging also provides insight into the process by which the dislocations glide. Dislocations with dangling bonds on unpaired columns are found to be more mobile because the dangling bonds mediate the bond exchanges required for the dislocations to move. Furthermore, a screw dislocation has been resolved to dissociate into a Shockley partial-dislocation pair along two different directions, revealing a way for the screw dislocation to glide in the material. The results show that dynamic STEM imaging has the potential to uncover the details of dislocation motion not easily accessible by other means.

Original language	English
Article number	143107
Journal	Applied Physics Letters
Volume	109
Issue number	14
DOIs	https://doi.org/10.1063/1.4963765
State	Published - Oct 3 2016

Funding

This research was sponsored by the U.S. DOE, Office of Energy Efficiency and Renewable Energy, Foundational Program to Advance Cell Efficiency (F-PACE, DE-FOA-0000492), (CL, YLW, NP, YFY, SJP), the Office of DOE-BES, Materials Science and Engineering Division (ARL), DOE Grant No. DE-FG02-09ER46554 (YYZ, STP), and a user project supported by ORNL's Center for Nanophase Materials Sciences (CNMS), which is also sponsored by DOE-BES. Supercomputer time was provided by the National Center for Supercomputing Applications which is supported by the DOE Office of Science under Contract No. DE-AC02-05CH11231, and the Extreme Science and Engineering Discovery Environment (XSEDE), which is supported by National Science Foundation Grant No. ACI-1053575. Chen Li [No. 656378] and Timothy Pennycook [No.655760] are currently funded by the European Union's Marie Skłodowska-Curie Grants.

Funders	Funder number
CNMS
European Union's Marie Skłodowska-Curie
ORNL's Center for Nanophase Materials Sciences
Office of DOE-BES
National Science Foundation	ACI-1053575
U.S. Department of Energy	DE-FG02-09ER46554
Office of Science	DE-AC02-05CH11231
Office of Energy Efficiency and Renewable Energy	DE-FOA-0000492
Basic Energy Sciences
Army Research Laboratory
Horizon 2020 Framework Programme	655760, 656378
Division of Materials Sciences and Engineering

Access to Document

10.1063/1.4963765

Cite this

@article{543cb3ec81984c138c5f1d492d839049,

title = "Column-by-column observation of dislocation motion in CdTe: Dynamic scanning transmission electron microscopy",

abstract = "The dynamics of partial dislocations in CdTe have been observed at the atomic scale using aberration-corrected scanning transmission electron microscopy (STEM), allowing the mobility of different dislocations to be directly compared: Cd-core Shockley partial dislocations are more mobile than Te-core partials, and dislocation cores with unpaired columns have higher mobility than those without unpaired columns. The dynamic imaging also provides insight into the process by which the dislocations glide. Dislocations with dangling bonds on unpaired columns are found to be more mobile because the dangling bonds mediate the bond exchanges required for the dislocations to move. Furthermore, a screw dislocation has been resolved to dissociate into a Shockley partial-dislocation pair along two different directions, revealing a way for the screw dislocation to glide in the material. The results show that dynamic STEM imaging has the potential to uncover the details of dislocation motion not easily accessible by other means.",

author = "Chen Li and Zhang, {Yu Yang} and Pennycook, {Timothy J.} and Yelong Wu and Lupini, {Andrew R.} and Naba Paudel and Pantelides, {Sokrates T.} and Yanfa Yan and Pennycook, {Stephen J.}",

note = "Publisher Copyright: {\textcopyright} 2016 Author(s).",

year = "2016",

month = oct,

day = "3",

doi = "10.1063/1.4963765",

language = "English",

volume = "109",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "14",

}

TY - JOUR

T1 - Column-by-column observation of dislocation motion in CdTe

T2 - Dynamic scanning transmission electron microscopy

AU - Li, Chen

AU - Zhang, Yu Yang

AU - Pennycook, Timothy J.

AU - Wu, Yelong

AU - Lupini, Andrew R.

AU - Paudel, Naba

AU - Pantelides, Sokrates T.

AU - Yan, Yanfa

AU - Pennycook, Stephen J.

PY - 2016/10/3

Y1 - 2016/10/3

N2 - The dynamics of partial dislocations in CdTe have been observed at the atomic scale using aberration-corrected scanning transmission electron microscopy (STEM), allowing the mobility of different dislocations to be directly compared: Cd-core Shockley partial dislocations are more mobile than Te-core partials, and dislocation cores with unpaired columns have higher mobility than those without unpaired columns. The dynamic imaging also provides insight into the process by which the dislocations glide. Dislocations with dangling bonds on unpaired columns are found to be more mobile because the dangling bonds mediate the bond exchanges required for the dislocations to move. Furthermore, a screw dislocation has been resolved to dissociate into a Shockley partial-dislocation pair along two different directions, revealing a way for the screw dislocation to glide in the material. The results show that dynamic STEM imaging has the potential to uncover the details of dislocation motion not easily accessible by other means.

AB - The dynamics of partial dislocations in CdTe have been observed at the atomic scale using aberration-corrected scanning transmission electron microscopy (STEM), allowing the mobility of different dislocations to be directly compared: Cd-core Shockley partial dislocations are more mobile than Te-core partials, and dislocation cores with unpaired columns have higher mobility than those without unpaired columns. The dynamic imaging also provides insight into the process by which the dislocations glide. Dislocations with dangling bonds on unpaired columns are found to be more mobile because the dangling bonds mediate the bond exchanges required for the dislocations to move. Furthermore, a screw dislocation has been resolved to dissociate into a Shockley partial-dislocation pair along two different directions, revealing a way for the screw dislocation to glide in the material. The results show that dynamic STEM imaging has the potential to uncover the details of dislocation motion not easily accessible by other means.

UR - http://www.scopus.com/inward/record.url?scp=84990047920&partnerID=8YFLogxK

U2 - 10.1063/1.4963765

DO - 10.1063/1.4963765

M3 - Article

AN - SCOPUS:84990047920

SN - 0003-6951

VL - 109

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 14

M1 - 143107

ER -

Column-by-column observation of dislocation motion in CdTe: Dynamic scanning transmission electron microscopy

Abstract

Funding

Access to Document

Other files and links

Fingerprint

Cite this